M
Michael Sheehy
Researcher at University of Limerick
Publications - 6
Citations - 63
Michael Sheehy is an academic researcher from University of Limerick. The author has contributed to research in topics: Shock (mechanics) & Acceleration. The author has an hindex of 4, co-authored 6 publications receiving 57 citations.
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Journal ArticleDOI
The Dynamics of Multiple Pair-Wise Collisions in a Chain for Designing Optimal Shock Amplifiers
TL;DR: In this paper, the authors examine the dynamics of velocity amplification through pairwise collisions between multiple masses in a chain, in order to develop useful machines for very high acceleration shock testing of MEMS devices.
Journal ArticleDOI
The Failure Mechanisms of Micro‐Scale Cantilevers Under Shock and Vibration Stimuli
TL;DR: In this article, micro-cantilevers were analyzed under vibration and shock on a modified Hopkinson pressure bar and vibration table to determine the mechanical properties of single crystal silicon (SCS).
Proceedings ArticleDOI
The failure mechanisms of micro-scale cantilevers in shock and vibration stimuli
TL;DR: In this paper, a modified Hopkinson pressure bar (HPB) is used to investigate failure mechanisms of single crystal silicon (SCS) micro-cantilever devices under high-g accelerations.
Journal ArticleDOI
Shock pulse shaping in a small-form factor velocity amplifier
TL;DR: In this article, a velocity amplifier (VAMP) was used for high-acceleration shock testing of micro-scale devices, where multiple sequential impacts were applied to amplify velocity through a system of three progressively smaller masses constrained to move in the vertical axis.
The dynamics of shock amplification through multiple impacts
TL;DR: In this paper, the authors examined the dynamics of velocity amplification through pairwise collisions between multiple masses in a chain, in order to develop guidelines for the design of useful machines, which could be extremely versatile: low-cost; providing a very large range of shocks for testing; and a safer and more precise alternative to ballistic testing for the very high acceleration shock-testing of inherently rugged emerging electronic devices like MEMS, nano-optics devices, and sensors.