M
Michael Stintz
Researcher at Dresden University of Technology
Publications - 93
Citations - 2048
Michael Stintz is an academic researcher from Dresden University of Technology. The author has contributed to research in topics: Particle & Particle size. The author has an hindex of 21, co-authored 86 publications receiving 1780 citations.
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Journal ArticleDOI
Nanoparticle exposure at nanotechnology workplaces: a review.
TL;DR: An assessment of the current available workplace measurement data using a matrix, which is related to nanomaterials and work processes, shows, that data are available on the likelihood of release and possible exposure and two approaches to derive realistic exposure values are presented.
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Potential release scenarios for carbon nanotubes used in composites
Bernd Nowack,Raymond M. David,Heinz Fissan,Howard Morris,Jo Anne Shatkin,Michael Stintz,Richard G. Zepp,Derk H. Brouwer +7 more
TL;DR: It can be concluded that in general, significant release of CNTs from products and articles is unlikely except in manufacturing and subsequent processing, tires, recycling, and potentially in textiles.
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Method for the characterization of the abrasion induced nanoparticle release into air from surface coatings
TL;DR: In this paper, a novel method for quantification of the nanoparticle release into air from surface coatings was developed based on the combination of a defined abrasion process with highly sensitive methods to quantify airborne particle concentration.
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Characterization of Nanoparticle Release from Surface Coatings by the Simulation of a Sanding Process
TL;DR: Based on a survey of commercial sanding machines, the relevant sanding process parameters were employed for the design of a miniature sanding test setup in a particle-free environment for the quantification of the nanoparticle release into air from surface coatings.
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Dynamic Light Scattering for the Characterization of Polydisperse Fractal Systems: II. Relation between Structure and DLS Results
TL;DR: In this paper, the structure of different pyrogenic silica grades has been characterized by static light and X-ray scattering and the diffusional properties were obtained by multi-angle DLS measurements.