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Muralidhar Ambati

Researcher at University of California, Berkeley

Publications -  10
Citations -  2609

Muralidhar Ambati is an academic researcher from University of California, Berkeley. The author has contributed to research in topics: Surface plasmon & Diffraction. The author has an hindex of 8, co-authored 10 publications receiving 2278 citations. Previous affiliations of Muralidhar Ambati include University of California, Los Angeles.

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Ultrasonic metamaterials with negative modulus

TL;DR: A new class of ultrasonic metamaterials consisting of an array of subwavelength Helmholtz resonators with designed acoustic inductance and capacitance with an effective dynamic modulus with negative values near the resonance frequency is reported.
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Method for retrieving effective properties of locally resonant acoustic metamaterials

TL;DR: In this paper, a method to extract effective material properties from reflection and transmission coefficients, which can be measured experimentally, is presented, and the dependency of effective properties on the positions of the boundaries of the acoustic metamaterial is discussed.
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Surface resonant states and superlensing in acoustic metamaterials

TL;DR: In this article, negative effective mass density is determined to be the necessary condition for the existence of surface states on acoustic metamaterials, and the microscopic picture of these unique surface states is presented.
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Observation of Stimulated Emission of Surface Plasmon Polaritons

TL;DR: The design, fabrication, and characterization of SPP waveguides, thin gold metal strips, embedded in erbium (Er) doped phosphate glass is presented, which can be suitable as integrated devices coupling electronic and photonic data transmissions as well as SPP amplifiers and SPP lasers.
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Realization of optical superlens imaging below the diffraction limit

TL;DR: Fang et al. as discussed by the authors used a thin silver slab for superlensing and obtained an image of a 50 nm half-pitch object at λ 0/7 resolution, which is well below the diffraction limit.