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Muruganathan Ramanathan

Researcher at Oak Ridge National Laboratory

Publications -  22
Citations -  910

Muruganathan Ramanathan is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Thin film & Polymer. The author has an hindex of 13, co-authored 22 publications receiving 841 citations. Previous affiliations of Muruganathan Ramanathan include Max Planck Society & Argonne National Laboratory.

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Amphiphile nanoarchitectonics: from basic physical chemistry to advanced applications

TL;DR: This perspective summarizes research on self-assembly of amphiphilic molecules such as lipids, surfactants or block copolymers that are a focus of interest for many colloid, polymer, and materials scientists and which have become increasingly important in emerging nanotechnology and practical applications, latter of which are often accomplished by amphiphile-like polymers.
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Mesoscale morphologies in polymer thin films.

TL;DR: A review of mesoscale morphologies in polymer thin films from the viewpoint of origination of structure formation, structure development and the interaction forces that govern these morphologies is presented in this article.
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Materials self-assembly and fabrication in confined spaces

TL;DR: In this paper, a review of the potential developments in various aspects of confined spaces for molecular self-assembly under one roof is presented, including topological, geometrical, chemical and biological confinements.
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Emerging trends in metal-containing block copolymers: synthesis, self-assembly, and nanomanufacturing applications

TL;DR: In this article, metal-containing block copolymers with metals confined in one or more blocks are presented as candidate materials for nanomanufacturing applications due to their unprecedented nanoscale pattern transfer capabilities.
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Crossover behavior in the hydrogen sensing mechanism for palladium ultrathin films

TL;DR: This study is aimed at deciphering the nanostructure-property relationships of ultrathin palladium films used as hydrogen gas sensors and finds that the crossover in these films is observed at a thickness of approximately 5 nm.