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Myung-Ho Bae

Researcher at Korea Research Institute of Standards and Science

Publications -  128
Citations -  5150

Myung-Ho Bae is an academic researcher from Korea Research Institute of Standards and Science. The author has contributed to research in topics: Graphene & Josephson effect. The author has an hindex of 30, co-authored 119 publications receiving 4679 citations. Previous affiliations of Myung-Ho Bae include Korea University of Science and Technology & Pohang University of Science and Technology.

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Ballistic to diffusive crossover of heat flow in graphene ribbons

TL;DR: These results show how manipulation of two-dimensional device dimensions and edges can be used to achieve full control of their heat-carrying properties, approaching fundamentally limited upper or lower bounds.
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Heat conduction across monolayer and few-layer graphenes.

TL;DR: In this paper, the authors reported the thermal conductance of Au/Ti/graphene/SiO2 interfaces typical of graphene transistor contacts, and showed that they can limit not only electrical transport but also thermal dissipation from submicrometer graphene devices.
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Stacked Graphene-Al2O3 Nanopore Sensors for Sensitive Detection of DNA and DNA–Protein Complexes

TL;DR: The development of a multilayered graphene-Al(2)O(3) nanopore platform for the sensitive detection of DNA and DNA-protein complexes and enables nanopore integration with new graphene-based structures, including nanoribbons and nanogaps, for single-molecule DNA sequencing and medical diagnostic applications.
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Polycrystalline Graphene Ribbons as Chemiresistors

TL;DR: This paper presents a probabilistic analysis of the response of nanoporous materials to high-performance liquid chromatographyatography techniques and shows clear patterns of degradation that can be exploited for nano-scale materials engineering.
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Imaging, simulation, and electrostatic control of power dissipation in graphene devices.

TL;DR: This work directly image hot spot formation in functioning mono- and bilayer graphene field effect transistors using infrared thermal microscopy and finds that thermal imaging combined with self-consistent simulation provide a noninvasive approach for more deeply examining transport and energy dissipation in nanoscale devices.