Ge–Sb–Te alloys are widely used for data recording based on the rapid and reversible amorphous-to-crystalline phase transformation that is accompanied by increases in the optical reflectivity and the electrical conductivity. However, uncertainties about the optical band gaps and electronic transport properties of these phases have persisted because of inappropriate interpretation of reported data and the lack of definitive analytical studies. In this paper we characterize the most widely used composition, Ge2Sb2Te5, in its amorphous, face-centered-cubic, and hexagonal phases, and explain the origins of inconsistent or unphysical results in previous reports. The optical absorption in all of these phases follows the relationship αhν∝(hν−Egopt)2, which corresponds to the optical transitions in most amorphous semiconductors as proposed by Tauc, Grigorovici, and Vancu [Tauc et al., Phys. Status Solidi 15, 627 (1966)], and to those in indirect-gap crystalline semiconductors. The optical band gaps of the amorpho...

Investigation of the optical and electronic properties of Ge2Sb2Te5 phase change material in its amorphous, cubic, and hexagonal phases

Graphene and related two-dimensional materials provide an ideal platform for next generation disruptive technologies and applications. Exploiting these solution-processed two-dimensional materials in printing can accelerate this development by allowing additive patterning on both rigid and conformable substrates for flexible device design and large-scale, high-speed, cost-effective manufacturing. In this review, we summarise the current progress on ink formulation of two-dimensional materials and the printable applications enabled by them. We also present our perspectives on their research and technological future prospects.

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Functional inks and printing of two-dimensional materials.

http://www-personal.umich.edu/~kaviany/researchtopics/lds_ijhmt_journal.pdf

Micro-thermoelectric cooler: interfacial effects on thermal and electrical transport

Germanium telluride undergoes rapid transition between polycrystalline and amorphous states under either optical or electrical excitation. While the crystalline phases are predicted to be semiconductors, polycrystalline germanium telluride always exhibits p-type metallic conductivity. We present a study of the electronic structure and formation energies of the vacancy and antisite defects in both known crystalline phases. We show that these intrinsic defects determine the nature of free-carrier transport in crystalline germanium telluride. Germanium vacancies require roughly one-third the energy of the other three defects to form, making this by far the most favorable intrinsic defect. While the tellurium antisite and vacancy induce gap states, the germanium counterparts do not. A simple counting argument, reinforced by integration over the density of states, predicts that the germanium vacancy leads to empty states at the top of the valence band, thus giving a complete explanation of the observed p-type metallic conduction.

Electronic structure of intrinsic defects in crystalline germanium telluride

Thermoelectric materials convert a temperature difference into electricity and vice versa. [1–3] Such materials utilize the Seebeck effect for power generation and the Peltier effect for cooling. In the Seebeck effect, a temperature difference across a material causes the diffusion of charged carriers across that gradient, thus creating a voltage difference between the hot and cold ends of the material. Conversely, the Peltier effect explains the fact that when current flows through a material a temperature gradient arises because the charged carriers exchange thermal energy. Thermoelectrics perform these functions without moving parts or toxic gases, which make them unique among power generation and cooling methods. Presently, thermoelectrics find only limited use because of their poor efficiency. The efficiency of a thermoelectric material is determined by the dimensionless figure of merit

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Size‐Dependent Transport and Thermoelectric Properties of Individual Polycrystalline Bismuth Nanowires

The electrical resistivity and the Seebeck coefficient of thermally evaporated thin bismuth films of thicknesses from 300 to 1900 A\r{} have been measured in the temperature range 300--470 K. The latter is negative and its magnitude is found to increase initially with increasing temperature, reach a maximum, and then decrease with a further rise in temperature. The temperature at which the Seebeck coefficient is maximum is found to be thickness dependent, decreasing with increasing thickness. The observed dependence is explained by considering that the Fermi energy is temperature dependent. Bismuth films show a negative temperature coefficient of resistivity. The thickness dependence of the electrical resistivity and the Seebeck coefficient of simultaneously prepared films are analyzed using the newer effective mean-free-path model. From the analysis, important material constants like the mean free path, the electron concentration, and the effective mass of electrons have been evaluated.

Size and temperature effects on the Seebeck coefficient of thin bismuth films

The results of electrical conductivity and thermoelectric studies on antimony telluride, a promising thermoelectric material, in the thin film state are reported. Films were vacuum-deposited on to clean glass substrates with thickness between 50 and 200 nm and studied in the temperature interval 300 to 470 K. On heating the as-grown films, there is a sharp fall both in the Seebeck coefficient and the electrical resistivity at around 340 to 370 K for all the films. This is attributed to an amorphous to crystalline transition, which is confirmed by X-ray diffractogram and electron diffraction patterns.[/p]

Electrical conductivity and thermoelectric power of amorphous Sb2Te3 thin films and amorphous-crystalline transition

Size and temperature effects on the thermoelectric power and electrical resistivity of bismuth telluride thin films.

Crystalline Sb2Te3 thin films of different thicknesses have been prepared by subsequent annealing (at 500 K) of vacuum deposited, as‐grown, amorphous thin films of Sb2Te3 prepared on glass substrates at room temperature. Thermoelectric power and electrical resistivity of these annealed (crystalline) films have been determined as a function of temperature. The size dependence of thermoelectric power and electrical resistivity have been analyzed by the effective mean free path model of size effect. It is found that both the thermoelectric power and the electrical resistivity are linear functions of the reciprocal of thickness of the films. The data from the analyses of thermoelectric power and electrical resistivity have been combined to evaluate important material parameters such as carrier concentration, their mean free path, Fermi energy, and effective mass. The values of some of these are compared with the previous available values from literature.

Thermoelectric power and electrical resistivity of crystalline antimony telluride (Sb2Te3) thin films: Temperature and size effects

Tellurium thin films of thicknesses between 25 and 200 nm have been vacuum-deposited on glass substrates at room temperature in a vacuum of 5×10−5torr. The thermoelectric power measurements on these films have been carried out, after annealing, in the temperature range from 300 to about 500 K. It is found from the study that thermoelectric power is independent of temperature and is also, apparently, independent of thickness, over the range of temperatures and thicknesses investigated. The results are discussed on the basis of size effect and thermoelectric effect theories.

N. Soundararajan

Papers

Size and temperature effects on the Seebeck coefficient of thin bismuth films

Electrical conductivity and thermoelectric power of amorphous Sb2Te3 thin films and amorphous-crystalline transition

Size and temperature effects on the thermoelectric power and electrical resistivity of bismuth telluride thin films.

Thermoelectric power and electrical resistivity of crystalline antimony telluride (Sb2Te3) thin films: Temperature and size effects

Thermoelectric power of tellurium thin films and its thickness and temperature dependence