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Nico Lovergine

Researcher at University of Salento

Publications -  91
Citations -  769

Nico Lovergine is an academic researcher from University of Salento. The author has contributed to research in topics: Metalorganic vapour phase epitaxy & Nanowire. The author has an hindex of 13, co-authored 87 publications receiving 694 citations. Previous affiliations of Nico Lovergine include Applied Science Private University & International Military Sports Council.

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Picosecond response times in GaAs/AlGaAs core/shell nanowire-based photodetectors

TL;DR: In this article, the Schottky-contacted core/shell GaAs/AlGaAs and bare GaAs nanowires were fabricated and characterized for high-speed metal-semiconductor-metal (MSM) photodetectors.
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Polarization anisotropy of individual core/shell GaAs/AlGaAs nanowires by photocurrent spectroscopy

TL;DR: In this article, the photodetection properties of individual core/shell GaAs/AlGaAs nanowires and their behavior under linearly polarized light were investigated and high quantum efficiency values (10% at 600 nm) were obtained which are attractive for a wide range of optoelectronic devices.
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On direct-writing methods for electrically contacting GaAs and Ge nanowire devices

TL;DR: In this article, local electron beam induced deposition is shown to be a reliable and facile route for producing robust electrical contacts to individual vapor phase-grown nanowires in a manner that enables study of their actual carrier transport properties.
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Three-Dimensional Composition and Electric Potential Mapping of III-V Core-Multishell Nanowires by Correlative STEM and Holographic Tomography.

TL;DR: In this paper, the functional potentials of a single GaAs-AlGaAs core-multishell nanowire were derived by combining EHT and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) tomography.
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Inhomogeneous Strain Relaxation and Defect Distribution of Znte Layers Deposited on (100)Gaas by Metalorganic Vapor-Phase Epitaxy

TL;DR: In this article, the structural characterization of ZnTe epilayers grown on (100)GaAs by metalorganic vapor phase epitaxy is reported, where both pure edge Lomer and 60°mixed misfit dislocations are identified at the interface along with partial dislocation bounding stacking faults, their overall density and distance distribution indicating the occurrence of a residual compressive strain at the heterostructure interface.