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Nobuhiko P. Kobayashi

Researcher at University of California, Santa Cruz

Publications -  197
Citations -  4419

Nobuhiko P. Kobayashi is an academic researcher from University of California, Santa Cruz. The author has contributed to research in topics: Nanowire & Thin film. The author has an hindex of 24, co-authored 183 publications receiving 4157 citations. Previous affiliations of Nobuhiko P. Kobayashi include Alternatives & Santa Clara University.

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Vertically Self-Organized InAs Quantum Box Islands on GaAs(100)

TL;DR: In this paper, the authors show that self-organized growth along the vertical (i.e., growth) direction of a GaAs island is induced by interacting strain fields induced by the islands which give rise to a preferred direction for In migration.
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Nanoparticle in Alloy Approach to Efficient Thermoelectrics: Silicides in SiGe

TL;DR: A "nanoparticle-in-alloy" material approach with silicide and germanide fillers leading to a potential 5-fold increase in the thermoelectric figure of merit of SiGe alloys at room temperature and 2.5 times increase at 900 K is presented.
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Ultrasmooth silver thin films deposited with a germanium nucleation layer.

TL;DR: The presence of the thin layer of Ge changes the growth kinetics of the electron-beam-evaporated Ag, leading to Ag films with smooth surface morphology and high electrical conductivity, which are very promising for large-scale applications as molecular anchors, optical metamaterials, plasmonic devices, and several areas of nanophotonics.
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Critical diameter for III-V nanowires grown on lattice-mismatched substrates

TL;DR: In this article, the critical diameter (CD) of III-V compound semiconductor epitaxial nanowires (NWs) grown on lattice mismatched substrates using Au-catalyzed vapor-liquid solid growth was observed.
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In situ, atomic force microscope studies of the evolution of InAs three‐dimensional islands on GaAs(001)

TL;DR: In this paper, the size evolution of molecular beam epitaxy-grown strained InAs 3D islands on GaAs(001) was examined using in situ ultrahigh vacuum atomic force microscopy.