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Anupam Madhukar

Researcher at University of Southern California

Publications -  357
Citations -  11960

Anupam Madhukar is an academic researcher from University of Southern California. The author has contributed to research in topics: Quantum dot & Molecular beam epitaxy. The author has an hindex of 58, co-authored 357 publications receiving 11770 citations. Previous affiliations of Anupam Madhukar include University of Chicago & Louisiana State University.

Papers
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Vertically Self-Organized InAs Quantum Box Islands on GaAs(100)

TL;DR: In this paper, the authors show that self-organized growth along the vertical (i.e., growth) direction of a GaAs island is induced by interacting strain fields induced by the islands which give rise to a preferred direction for In migration.
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Onset of incoherency and defect introduction in the initial stages of molecular beam epitaxical growth of highly strained InxGa1−xAs on GaAs(100)

TL;DR: In this paper, direct evidence for interplanar relaxation in islands at the initial stages of strained epitaxy was presented using molecular beam epitaxically deposited In 0.5Ga0.5As on GaAs(100), and the existence of atomic displacements in the substrates to unexpectedly large depths of ∼150 A was found.
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High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous Si O 2 and the Si-Si O 2 Interface

TL;DR: In this paper, the chemical structure of thin Si${\mathrm{O}}_{2}$ films and Si${O}$-Si interfaces has been investigated using high-resolution x-ray photoelectron spectroscopy.
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Local atomic and electronic structure of oxide/GaAs and SiO2/Si interfaces using high-resolution XPS

TL;DR: In this paper, the chemical structures of thin SiO2 films, thin native oxides of GaAs (20-30 A), and the respective oxide-semiconductor interfaces, have been investigated using high-resolution X-ray photoelectron spectroscopy.
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High detectivity InAs quantum dot infrared photodetectors

TL;DR: In this paper, the authors reported a high detectivity of 3×1011 cm 1/2/W at 78 K for normal-incidence quantum dot infrared photodetectors with ten layers of undoped InAs/InGaAs/GaAs active regions.