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Showing papers by "Olivier J. F. Martin published in 1992"


Journal ArticleDOI
TL;DR: In this paper, the thermal behavior of visible AlGaInP and GaInP ridge laser diodes has been investigated numerically and experimentally and it is shown that various parameters critically influence the thermal resistance, R, of such devices.
Abstract: The thermal behavior of visible AlGaInP-GaInP ridge laser diodes was investigated numerically and experimentally. It is shown that various parameters critically influence the thermal resistance, R, of such devices. R is inversely proportional to the thermal conductivity of the heat sink. A substantial improvement in R is achieved for junction-side-down mounting compared to junction-side-up. R depends strongly on the width, w, of the ridge, and this effect is different for junction-side-up or junction-side-down mounting. In the first case, R approximately log(w) and in the second, R approximately 1/w. The thickness of the soldering material is a sensitive parameter which may increase the value of R by up to 15 K/W. For junction-side-up mounted devices, the top metallization layer has a very favorable effect: a 1- mu m-thick gold layer reduces R by 30%. It is shown that when a laser is switched on, the thermal steady state is reached in the millisecond time range. The experimental results show very good agreement with numerical data. >

56 citations


01 Jan 1992
TL;DR: In this article, Alxga1-Xas Reference Reference EPFL-CONF-164911 is used as reference for the Web of Science Record created on 2011-04-11, modified on 2017-05-10
Abstract: Keywords: Alxga1-Xas Reference EPFL-CONF-164911View record in Web of Science Record created on 2011-04-11, modified on 2017-05-10

4 citations


01 Jan 1992
TL;DR: The thermal behavior of visible AIGaInP-GaInP ridge laser diodes is investigated numerically and experimen- tally in this paper, where various parameters critically influence the thermal resistance R of such devices.
Abstract: The thermal behavior of visible AIGaInP-GaInP ridge laser diodes is investigated numerically and experimen- tally. It is shown that various parameters critically influence the thermal resistance R of such devices. R is inversely propor- tional to the thermal conductivity of the heatsink. A substantial improvement in R-quite larger than in the AlGaAs system-is achieved for junction-side-down mounting compared to junc- tion-side-up. R depends strongly on the width w of the ridge and this effect is different for junction-side-up or down mount- ing. In the first case, R - log (w) and in the second, R - l/w. The thickness of the soldering material is a sensitive parameter which may increase the value of R by up to 15 K/W. On the other hand, for junction-side-up mounted devices, the top me- tallization layer has a very favorable effect: a 1 pm thick gold layer reduces R by 30%. The dynamics of thermal phenomena is also studied. It is shown that when a laser is switched on the steady state is reached in the ms time range. Finally, our ex- perimental results show a very good agreement with our nu- merical data.

1 citations