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Patrick Bardsley
Researcher at Cirrus Logic
Publications - 14
Citations - 95
Patrick Bardsley is an academic researcher from Cirrus Logic. The author has contributed to research in topics: Field (physics) & Born series. The author has an hindex of 6, co-authored 14 publications receiving 68 citations. Previous affiliations of Patrick Bardsley include University of Utah & University of Texas at Austin.
Papers
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Change point tests in functional factor models with application to yield curves
TL;DR: In this paper, the authors introduce several methods to test the null hypothesis that the mean structure of a time series of curves does not change, i.e., a change point is not detected with a large probability.
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Quantitative photoacoustic imaging of two-photon absorption.
TL;DR: In this article, a mathematical model for quantitative image reconstruction in two-photon photoacoustic tomography (TP-PAT) is presented, and a computational strategy for the reconstruction of the optical absorption coefficients is proposed.
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Towards a gradient flow for microstructure
Patrick Bardsley,Katayun Barmak,Eva Eggeling,Yekaterina Epshteyn,David Kinderlehrer,Shlomo Ta'asan +5 more
TL;DR: In this paper, the emergence of the grain boundary character distribution (GBCD), a statistic that details texture evolution discovered recently, and illustrate why it should be considered a material property, is described.
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Restarted inverse Born series for the Schr\"odinger problem with discrete internal measurements
TL;DR: In this paper, the convergence and stability results for the inverse Born series were generalized to mappings between Banach spaces, and a class of iterative methods containing the Gauss-Newton and Chebyshev-Halley methods were obtained.
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Kirchhoff migration without phases
TL;DR: In this paper, a simple frequency domain preprocessing step was proposed to recover the full waveform scattered field from intensity data, which can be used to image scatterers when the wave field phase information is lost at the receivers and only intensities are measured.