P
Patrick Schiavone
Researcher at Centre national de la recherche scientifique
Publications - 62
Citations - 891
Patrick Schiavone is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Extreme ultraviolet lithography & Aerial image. The author has an hindex of 15, co-authored 62 publications receiving 862 citations. Previous affiliations of Patrick Schiavone include Joseph Fourier University.
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The motility of normal and cancer cells in response to the combined influence of the substrate rigidity and anisotropic microstructure
Tzvetelina Tzvetkova-Chevolleau,Angélique Stéphanou,David Fuard,Jacques Ohayon,Patrick Schiavone,Philippe Tracqui +5 more
TL;DR: This work systematically analyse the differential response of normal (3T3) and cancer (SaI/N) fibroblastic cells and demonstrates that both cells exhibit differential morphology and motility responses to changes in substrate rigidity and microtopography.
Journal ArticleDOI
In vivo measurement of human brain elasticity using a light aspiration device.
Patrick Schiavone,Patrick Schiavone,Fabrice Chassat,Thomas Boudou,Emmanuel Promayon,F. Valdivia,Yohan Payan +6 more
TL;DR: In this paper, a model-driven compensation for the brain deformation during neurosurgery is proposed, where the deformation of the aspirated tissue is imaged via a mirror using an external camera.
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In vivo measurement of human brain elasticity using a light aspiration device
Patrick Schiavone,Patrick Schiavone,Fabrice Chassat,Thomas Boudou,Emmanuel Promayon,F. Valdivia,Yohan Payan +6 more
TL;DR: It is shown that for the first time, measurements are carried out per-operatively on the patient, just before the resection of the brain parenchyma, and an in vivo constitutive law of thebrain elasticity is extracted.
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Mold deformation in nanoimprint lithography
TL;DR: In this paper, the authors demonstrate that during the imprint process mold deformations really occur at the local scale of the patterns but also at a larger scale, which translates into non-negligible deformations within patterned or unpatterned zones.
Journal ArticleDOI
Application of Alternating-Type Phase Shift Mask to Polysilicon Level for Random Logic Circuits
TL;DR: This paper is the first report of a solution using an automatic shifter arrangement and a three-step phase-transition technique on etched-quartz alternating-type phase shift mask (PSM).