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Paul De Boeck

Researcher at Ohio State University

Publications -  217
Citations -  11170

Paul De Boeck is an academic researcher from Ohio State University. The author has contributed to research in topics: Item response theory & Differential item functioning. The author has an hindex of 45, co-authored 209 publications receiving 9517 citations. Previous affiliations of Paul De Boeck include Catholic University of Leuven & University of Amsterdam.

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Latent class models for diary method data: Parameter estimation by local computations

TL;DR: The usefulness of the approach is illustrated by estimating a latent Markov model involving a large number of measurement occasions and, subsequently, a hierarchical extension of the latentMarkov model that allows for transitions at different levels.
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The Conjunctive Model of Hierarchical Classes.

TL;DR: It is shown how conjunctive and disjunctive hierarchical classes models relate to Galois lattices, and how hierarchical classes analysis can be useful to construct lattice models of empirical data.
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Explanatory item response modeling of children's change on a dynamic test of analogical reasoning

TL;DR: The authors found that visual and verbal working memory and age-group were related to initial ability, where children with lower initial scores improved more in both groups and there was an additive effect of math achievement on degree of improvement; where higher achieving children improved more from pretest to posttest.
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The induction of solution rules in Raven's Progressive Matrices Test.

TL;DR: This paper shows that only a few rule types are necessary to describe all items of the Raven's Advanced Progressive Matrices test and shows that participants profit from this, that is, do they learn to apply these rules more fluently throughout the test?
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A Rasch model for detecting learning while solving an intelligence test

TL;DR: A dynamic extension of the Rasch model was developed from a Bayesian point of view, and it was shown how this allowed application of the model in a wide variety of test settings as mentioned in this paper.