P
Paul Jerram
Researcher at Electro-Voice
Publications - 25
Citations - 505
Paul Jerram is an academic researcher from Electro-Voice. The author has contributed to research in topics: CMOS & Image sensor. The author has an hindex of 10, co-authored 23 publications receiving 478 citations.
Papers
More filters
Proceedings ArticleDOI
The LLCCD: low-light imaging without the need for an intensifier
Paul Jerram,Peter J. Pool,Ray Bell,David J. Burt,S. Bowring,Simon Spencer,Mike Hazelwood,Ian Moody,Neil Catlett,Philip S. Heyes +9 more
TL;DR: In this paper, a low light level CCD can operate over a wide range of readout rates from TV to slow scan and give superior performance to that available from either intensified or slow-scan CCD sensors.
Proceedings ArticleDOI
Subelectron read noise at MHz pixel rates
TL;DR: In this article, a detailed assessment of these devices, including novel methods of measuring their properties when operated at peak mean signal levels well below one electron per pixel, is presented. And the authors conclude that these new deices have radically changed the balance in the perpetual trade-off between read out noise and the speed of readout.
Proceedings ArticleDOI
Back-thinned CMOS sensor optimization
TL;DR: Back-thinning of a CCD image sensor is a very well established process for achieving high quantum efficiency and results from two recent programmes to back-thin CMOS sensors show excellent quantum efficiency values.
Proceedings ArticleDOI
e2v new CCD and CMOS technology developments for astronomical sensors
TL;DR: In this article, the authors present recent development in the technology of silicon sensors for astronomical applications, and discuss increasing capacity and interest in the commercial supply of integrated camera systems, in addition to supplying sensors.
Proceedings ArticleDOI
Improving radiation tolerance in e2v CCD sensors
TL;DR: In this paper, the flat-band voltage shift following ionising radiation is reduced from typically 100-200 mV/kRad(Si) with standard devices to only 6 mV /kRad (Si), plus an associated reduction in the increase in surface dark signal.