P
Pijush Ghosh
Researcher at Indian Institute of Technology Madras
Publications - 68
Citations - 1075
Pijush Ghosh is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Polymer & Coating. The author has an hindex of 14, co-authored 58 publications receiving 823 citations. Previous affiliations of Pijush Ghosh include Johns Hopkins University & North Dakota State University.
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Determining Reliability of an Asphalt Mix Design: Case of Marshall Method
TL;DR: In this article, the authors highlight the variability involved in the asphalt mix design process and develop a procedure to estimate the reliability of a particular mix design based on Indian specifications, where mix design, like in many other countries, is performed in accordance with the Marshall method.
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Application of nanomechanical response of wrinkled thin films in surface feature generation
TL;DR: In this article, the authors applied the nanoindentation (NI) technique to generate controlled patterns on wrinkled polymeric thin film using nano-pillars, which can lead to different possible outcomes such as surface area enhancement, generation of rough surface topology, formation of template for nanopillars.
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Engineering polymer film porosity for solvent triggered actuation.
TL;DR: In this article, the authors report a novel approach for the fabrication of porous polymer films and their self-folding behavior in response to water and show that the pore architecture in the films significantly enhances the actuation speed.
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Non-affine deformation of free volume during strain dependent diffusion in polymer thin films
TL;DR: In this paper, the influence of non-affine deformation and recovery of free volume on the diffusion behavior of water molecules in polymers, as a function of tensile strain, was investigated.
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Pile-up response of polymer thin films to static and dynamic loading
TL;DR: In this paper, the effect of pile-up on the measured mechanical properties, such as, elastic modulus, hardness and hardness of thin polymeric polysilicon films is investigated.