scispace - formally typeset
P

Pisith Singjai

Researcher at Chiang Mai University

Publications -  117
Citations -  1606

Pisith Singjai is an academic researcher from Chiang Mai University. The author has contributed to research in topics: Carbon nanotube & Thin film. The author has an hindex of 20, co-authored 106 publications receiving 1282 citations. Previous affiliations of Pisith Singjai include Helsinki University of Technology.

Papers
More filters
Journal ArticleDOI

Stretchable and Flexible High-Strain Sensors Made Using Carbon Nanotubes and Graphite Films on Natural Rubber

TL;DR: Stretchable and flexible high-strain sensors that consist of entangled and randomly distributed multiwall carbon nanotubes or graphite flakes on a natural rubber substrate that can bear high strains for multifunctional applications are reported.
Journal ArticleDOI

The effect of carbon nanotube dispersion on CO gas sensing characteristics of polyaniline gas sensor.

TL;DR: The inclusion of CNT in MA-doped polyaniline is a promising method for achieving a conductive polymer gas sensor with good sensitivity, fast response, low-concentration detection and room-operating-temperature capability.
Journal ArticleDOI

Ultra-rapid VOCs sensors based on sparked-In2O3 sensing films

TL;DR: In this article, two indium wires were sparked and scanned repeatedly above Al 2 O 3 substrates equipped with Au interdigitated electrodes for 10-200 cycles at a high sparking voltage of 4.5-kV under atmospheric conditions.
Journal ArticleDOI

Formation of CuO nanorods and their bundles by an electrochemical dissolution and deposition process

TL;DR: In this article, the formation of the NRs and their bundles was explained by an aggregation mechanism, and a transformation of the Cu phase in the as-deposited sample to a single CuO phase was effected by an annealing treatment at 500°C.
Journal ArticleDOI

Electrical resistivity of bulk multi-walled carbon nanotubes synthesized by an infusion chemical vapor deposition method

TL;DR: In this paper, a method to measure an electrical resistance of bulk carbon nanotubes (MWNTs) was carried out under stress between two conducting plates, suggesting that the measuring method provides a simple tool to monitor the degree of structural defects of MWNTs.