R
R. Joseph Kline
Researcher at National Institute of Standards and Technology
Publications - 103
Citations - 11349
R. Joseph Kline is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Polymer & Thin film. The author has an hindex of 44, co-authored 101 publications receiving 10471 citations. Previous affiliations of R. Joseph Kline include Stanford University & Lawrence Berkeley National Laboratory.
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Quantitative analysis of lattice disorder and crystallite size in organic semiconductor thin films
TL;DR: In this article, a Fourier-transform peak shape analysis based on the method of Warren and Averbach (WA) was used to estimate the crystallite size and cumulative lattice disorder of three prototypical, high-performing organic semiconducting materials.
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Molecular characterization of organic electronic films.
TL;DR: A general methodology for combining multiple, complementary techniques that provide accurate unit cell dimensions and molecular orientation results in a nearly complete picture of the organic film morphology.
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Correlations between Mechanical and Electrical Properties of Polythiophenes
Brendan O'Connor,Edwin P. Chan,Calvin K. Chan,Brad Conrad,Lee J. Richter,R. Joseph Kline,Martin Heeney,Iain McCulloch,Christopher L. Soles,Dean M. DeLongchamp +9 more
TL;DR: In this paper, the elastic moduli of polythiophenes, regioregular poly(3-hexylthiophene) (P3HT) and poly-(2,5-bis (3-alkylthyphene-2-yl)thieno[3,2-b]thiophee) (pBTTT) are compared to their field effect mobility showing a proportional trend.
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Interfacial Segregation in Polymer/Fullerene Blend Films for Photovoltaic Devices
David S. Germack,Calvin K. Chan,R. Joseph Kline,Daniel A. Fischer,David J. Gundlach,Michael F. Toney,Lee J. Richter,Dean M. DeLongchamp +7 more
TL;DR: In this paper, changes in the vertical composition profile of BHJ active layers cast on two hole transport layers (HTL) with significantly different surface energies (γ) were characterized using spectroscopic ellipsometry and near-edge X-ray absorption fine structure spectroscopy.
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Organic Single-Crystal Field-Effect Transistors of a Soluble Anthradithiophene
Oana D. Jurchescu,Sankar Subramanian,R. Joseph Kline,Steven D. Hudson,John E. Anthony,Thomas N. Jackson,David J. Gundlach +6 more
TL;DR: The first characterization of single-crystal devices of a new solution processable material that achieves technologically relevant performance in the polycrystalline thin film state was presented in this paper.