R
R. Joseph Kline
Researcher at National Institute of Standards and Technology
Publications - 103
Citations - 11349
R. Joseph Kline is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Polymer & Thin film. The author has an hindex of 44, co-authored 101 publications receiving 10471 citations. Previous affiliations of R. Joseph Kline include Stanford University & Lawrence Berkeley National Laboratory.
Papers
More filters
Journal ArticleDOI
Determination of the Internal Morphology of Nanostructures Patterned by Directed Self Assembly
Daniel F. Sunday,Matthew R. Hammond,Chengqing Wang,Wen-Li Wu,Dean M. DeLongchamp,Melia Tjio,Joy Cheng,Jed W. Pitera,R. Joseph Kline +8 more
TL;DR: A new measurement technique, resonant critical-dimension small-angle X-ray scattering (res-CDSAXS), is developed, to evaluate the 3D buried features inside the film and enable a better understanding of the fundamental physics behind the formation of buried features in DSA BCP films.
Journal ArticleDOI
Germaindacenodithiophene based low band gap polymers for organic solar cells
Zhuping Fei,Raja Shahid Ashraf,Zhenggang Huang,Jeremy Smith,R. Joseph Kline,Pasquale D'Angelo,Thomas D. Anthopoulos,James R. Durrant,Iain McCulloch,Martin Heeney +9 more
TL;DR: The first synthesis of a fused germaindacenodithiophene monomer and its polymerisation with 2,1,3-benzothiadiazole by Suzuki polycondensation is reported and the resulting polymer, PGeTPTBT, is semicrystalline, despite the presence of four bulky 2-ethylhexyl groups.
Journal ArticleDOI
Measuring Domain Sizes and Compositional Heterogeneities in P3HT‐PCBM Bulk Heterojunction Thin Films with 1H Spin Diffusion NMR Spectroscopy
Ryan C. Nieuwendaal,Hyun Wook Ro,David S. Germack,R. Joseph Kline,Michael F. Toney,Calvin K. Chan,Amit Agrawal,David J. Gundlach,David L. VanderHart,Dean M. DeLongchamp +9 more
TL;DR: In this paper, the application of 1H spin diffusion nuclear magnetic resonance (NMR) is expanded to polymer-fullerene blends for bulk heterojunction (BHJ) organic photovoltaics (OPV) by developing a new experimental methodology for measuring the thin films used in poly-3-hexylthiophene-phenyl C61-butyric acid methyl ester (P3HT-PCBM) OPV devices and by creating an analysis framework for estimating domain size distributions.
Journal ArticleDOI
Thin Film Microstructure of a Solution Processable Pyrene-Based Organic Semiconductor
Leah A. Lucas,Dean M. DeLongchamp,Lee J. Richter,R. Joseph Kline,Daniel A. Fischer,Bilal R. Kaafarani,Ghassan E. Jabbour +6 more
TL;DR: In this article, the microstructure of TQPP-12 was characterized using a combination of polarized photon absorption spectroscopies (X-ray, vis, and infrared), X-ray diffraction, and scanning probe techniques.
Journal ArticleDOI
Influence of Dielectric Surface Chemistry on the Microstructure and Carrier Mobility of an n‐Type Organic Semiconductor
Parul Dhagat,Hanna M. Haverinen,R. Joseph Kline,Youngsuk Jung,Daniel A. Fischer,Dean M. DeLongchamp,Ghassan E. Jabbour +6 more
TL;DR: In this paper, the microstructure evolution of 3,4,9,10-perylene-tetracarboxylic bis-benzimidazole (PTCBI) thin films resulting from conditions imposed during film deposition is examined.