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R. Joseph Kline

Researcher at National Institute of Standards and Technology

Publications -  103
Citations -  11349

R. Joseph Kline is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Polymer & Thin film. The author has an hindex of 44, co-authored 101 publications receiving 10471 citations. Previous affiliations of R. Joseph Kline include Stanford University & Lawrence Berkeley National Laboratory.

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Determination of the Internal Morphology of Nanostructures Patterned by Directed Self Assembly

TL;DR: A new measurement technique, resonant critical-dimension small-angle X-ray scattering (res-CDSAXS), is developed, to evaluate the 3D buried features inside the film and enable a better understanding of the fundamental physics behind the formation of buried features in DSA BCP films.
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Germaindacenodithiophene based low band gap polymers for organic solar cells

TL;DR: The first synthesis of a fused germaindacenodithiophene monomer and its polymerisation with 2,1,3-benzothiadiazole by Suzuki polycondensation is reported and the resulting polymer, PGeTPTBT, is semicrystalline, despite the presence of four bulky 2-ethylhexyl groups.
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Measuring Domain Sizes and Compositional Heterogeneities in P3HT‐PCBM Bulk Heterojunction Thin Films with 1H Spin Diffusion NMR Spectroscopy

TL;DR: In this paper, the application of 1H spin diffusion nuclear magnetic resonance (NMR) is expanded to polymer-fullerene blends for bulk heterojunction (BHJ) organic photovoltaics (OPV) by developing a new experimental methodology for measuring the thin films used in poly-3-hexylthiophene-phenyl C61-butyric acid methyl ester (P3HT-PCBM) OPV devices and by creating an analysis framework for estimating domain size distributions.
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Thin Film Microstructure of a Solution Processable Pyrene-Based Organic Semiconductor

TL;DR: In this article, the microstructure of TQPP-12 was characterized using a combination of polarized photon absorption spectroscopies (X-ray, vis, and infrared), X-ray diffraction, and scanning probe techniques.
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Influence of Dielectric Surface Chemistry on the Microstructure and Carrier Mobility of an n‐Type Organic Semiconductor

TL;DR: In this paper, the microstructure evolution of 3,4,9,10-perylene-tetracarboxylic bis-benzimidazole (PTCBI) thin films resulting from conditions imposed during film deposition is examined.