R
Rainer Blatt
Researcher at University of Innsbruck
Publications - 434
Citations - 39148
Rainer Blatt is an academic researcher from University of Innsbruck. The author has contributed to research in topics: Ion & Qubit. The author has an hindex of 86, co-authored 419 publications receiving 33415 citations. Previous affiliations of Rainer Blatt include University of Colorado Boulder & National Institute of Standards and Technology.
Papers
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Journal ArticleDOI
Experimental characterization of quantum dynamics through many-body interactions.
Daniel Nigg,Julio T. Barreiro,Philipp Schindler,Masoud Mohseni,Thomas Monz,M. Chwalla,Markus Hennrich,Rainer Blatt +7 more
TL;DR: This work shows the first, complete characterization of single-qubit processes using a single generalized measurement realized through multibody correlations with three ancilla qubits, and all diagonal elements of the process matrix can be estimated with a single setting.
Journal ArticleDOI
Microelectromechanical-System-Based Design of a High-Finesse Fiber Cavity Integrated with an Ion Trap
Moonjoo Lee,Minjae Lee,Seokjun Hong,Klemens Schüppert,Yeong-Dae Kwon,Taehyun Kim,Yves Colombe,Tracy E. Northup,Dong-il Dan Cho,Rainer Blatt,Rainer Blatt +10 more
TL;DR: In this article, the authors present a numerical study of a MEMS-based design of a fiber cavity integrated with an ion trap system, where each fiber mirror is supported by a microactuator that controls the mirror's position in three dimensions.
Journal ArticleDOI
PRECISE DETERMINATION OF 135Ba+ AND 137Ba+ HYPERFINE STRUCTURE
W. Becker,Rainer Blatt,G. Werth +2 more
Book ChapterDOI
Free Space Interference Experiments with Single Photons and Single Ions
TL;DR: In this paper, the authors investigated how strong focusing of light onto a single ion can increase the interaction strength to achieve efficient interaction between a photon and the ion and used a probabilistic measurement on scattered photons to generate entanglement between two ions that could be used to distribute information in a quantum network.
Journal ArticleDOI
Industrially microfabricated ion trap with 1 eV trap depth
Silke Auchter,Christopher Axline,Chiara Decaroli,V. Valentini,L. Purwin,Robin Oswald,Roland Matt,Elmar Aschauer,Yves Colombe,Philip C. Holz,Thomas Monz,Rainer Blatt,Philipp Schindler,Clemens Rössler,Jonathan Home +14 more
TL;DR: In this paper , an ion trap fabricated on stacked eight-inch wafers in a large-scale microelectro-mechanical system microfabrication process is presented.