R
Raj Kumar Gupta
Researcher at Agency for Science, Technology and Research
Publications - 47
Citations - 1485
Raj Kumar Gupta is an academic researcher from Agency for Science, Technology and Research. The author has contributed to research in topics: Sadness & Valence (psychology). The author has an hindex of 14, co-authored 45 publications receiving 1152 citations. Previous affiliations of Raj Kumar Gupta include Nanyang Technological University & Pt. B.D. Sharma PGIMS Rohtak.
Papers
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Journal ArticleDOI
Global Sentiments Surrounding the COVID-19 Pandemic on Twitter: Analysis of Twitter Trends.
May O. Lwin,Jiahui Lu,Anita Sheldenkar,Peter J. Schulz,Wonsun Shin,Raj Kumar Gupta,Yinping Yang +6 more
TL;DR: Findings suggest that emotion-driven collective issues around shared public distress experiences of the COVID-19 pandemic are developing and include large-scale social isolation and the loss of human lives.
Proceedings ArticleDOI
Semantic colorization with internet images
Alex Yong-Sang Chia,Shaojie Zhuo,Raj Kumar Gupta,Yu-Wing Tai,Siu-Yeung Cho,Ping Tan,Stephen Lin +6 more
TL;DR: A colorization system that leverages the rich image content on the internet and the user needs only to provide a semantic text label and segmentation cues for major foreground objects in the scene to achieve the desired result.
Proceedings ArticleDOI
Image colorization using similar images
TL;DR: A new example-based method to colorize a gray image using a fast cascade feature matching scheme to automatically find correspondences between superpixels of the reference and target images, which speeds up the colorization process and empowers the colorizations to exhibit a much higher extent of spatial consistency.
Proceedings ArticleDOI
Pull-in time dynamics as a measure of absolute pressure
TL;DR: In this article, the pull-in time of an electrostatically-actuated micromechanical fixed-fixed beam is shown to be a sensitive, and nearly linear function of ambient air pressure in the measured range of 0.1 mbar to 1013 mbar (1 atm or 760 Torr).
Proceedings ArticleDOI
The effect of release-etch holes on the electromechanical behaviour of MEMS structures
TL;DR: In this article, the authors demonstrate that the mechanical properties of an unetched microstructural element are strongly affected by the presence of etch holes, because of fringing-field effects at the edges of the etched holes.