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Rajiv K. Singh

Researcher at University of Florida

Publications -  287
Citations -  5945

Rajiv K. Singh is an academic researcher from University of Florida. The author has contributed to research in topics: Thin film & Pulsed laser deposition. The author has an hindex of 35, co-authored 274 publications receiving 5555 citations. Previous affiliations of Rajiv K. Singh include Entegris & Micron Technology.

Papers
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Adhesion between Nanoscale Rough Surfaces.

TL;DR: A model that more accurately describes the size of an asperity based on the measurable parameters of root-mean-square (rms) roughness and the distance between the asperities is derived and is compared to the experimentally determined force of adhesion in systems with nanoscale roughness.
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Adhesion between nanoscale rough surfaces. I. Role of asperity geometry

TL;DR: In this article, a model that more accurately describes the size of an asperity based on the measurable parameters of root-mean-square (rms) roughness and the distance between the asperities is derived.
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Luminescence of pulsed laser deposited Eu doped yttrium oxide films

TL;DR: In this article, a series of Europium doped yttrium oxide (Eu:Y2O3) phosphor thin films were grown using a pulsed laser deposition (PLD) technique at varying growth conditions.
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Capillary forces between surfaces with nanoscale roughness

TL;DR: In this article, approximate theoretical formulae are developed to predict the magnitude and onset of capillary adhesion between a smooth adhering particle and a surface with roughness on the nanometer scale.
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Thermophysical effects in laser processing of materials with picosecond and femtosecond pulses

TL;DR: In this article, the authors compared the threshold energies of ablation in gold as a function of pulse width from 10 ns to 100 fs, and further numerically computed results for gold and silicon on ablation rates, threshold surface temperatures, liquid thicknesses, and vaporization rates.