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Ralf Lüdemann

Researcher at Fraunhofer Society

Publications -  12
Citations -  605

Ralf Lüdemann is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Solar cell & Etching (microfabrication). The author has an hindex of 7, co-authored 12 publications receiving 587 citations.

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Journal ArticleDOI

Laser‐fired rear contacts for crystalline silicon solar cells

TL;DR: In this article, a laser-based process is used to alloy the contact points through the dielectric layer of a passivated emitter and a metal layer on top of a rear cell.
Journal ArticleDOI

Low damage reactive ion etching for photovoltaic applications

TL;DR: In this article, a two-layer model of vacancy distribution has been established: a layer of high vacancy concentration (1019 cm−3) up to a depth of 20 nm is followed by a second layer that extends over 1 μm with a vacancy concentration of 1016 cm−3.
Proceedings ArticleDOI

Laser-doped silicon solar cells by Laser Chemical Processing (LCP) exceeding 20% efficiency

TL;DR: In this article, the authors present experimental investigations on simple device structures to choose optimal laser parameters for selective emitter formation, which are used to fabricate high-efficiency oxide-passivated LFC solar cells that exceed 20% efficiency.
Journal ArticleDOI

Hydrogen passivation of multicrystalline silicon solar cells

TL;DR: The use of hydrogen for passivation of multicrystalline silicon in solar cell technology is described in this article, where three kinds of hydrogen incorporation into MC-Si solar cells have been evaluated: hydrogen diffusion out of a SiN-layer (SiN:H), low-energy hydrogen ion implantation (HII), and remote plasma hydrogen passivation (RPHP).
Proceedings ArticleDOI

New simplified methods for patterning the rear contact of RP-PERC high-efficiency solar cells

TL;DR: In this paper, two processing schemes for fabricating the rear contact pattern of the PERC-structure (passivated emitter and rear cell) are demonstrated. And both, thermally-grown silicon oxide (SiO/sub 2/) and plasma-deposited silicon nitride (SiN/sub x/) are used as the passivating rear layer.