Richard DeSalvo

TL;DR: This work monitors the induced phase change produced by a cascaded chi((2)):chi((2)) process in KTP near the phase-matching angle on a picosecond 1.06-microm-wavelength beam using the Z-scan technique and predicts the maximum small-signal effective nonlinear refractive index.

TL;DR: The bound electronic nonlinear refractive index, n/sub 2/ and two-photon absorption coefficient, /spl beta/ were measured in a variety of inorganic dielectric solids at the four harmonics of the Nd:YAG laser using Z scan as discussed by the authors.

TL;DR: A simple dual-wavelength (two-color) Z-scan geometry is demonstrated for measuring nonlinearities at frequency omega(p) owing to the presence of light at omega(e) and this technique gives the nondegenerate two-photon absorption (2PA) coefficient beta(omega(p); omega( e) and the nondEGenerate nonlinear refractive index n(2) i.e., cross-phase modulation.

TL;DR: The performance demonstrated by the thin-film modulators is on par with conventional lithium niobate modulators but with lower drive voltages, smaller device footprints, and potential compatibility for integration with large-scale silicon photonics.

TL;DR: This work demonstrates the polarization dependence of the nonlinear refractive index or two-photon absorption coefficient in BaF2, KTP, and GaAs at wavelengths of 532 and 1064 nm by incorporating a wave plate into the Z-scan apparatus.