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Robert M. Suter

Researcher at Carnegie Mellon University

Publications -  122
Citations -  5775

Robert M. Suter is an academic researcher from Carnegie Mellon University. The author has contributed to research in topics: Grain boundary & Diffraction. The author has an hindex of 33, co-authored 117 publications receiving 5038 citations. Previous affiliations of Robert M. Suter include Lawrence Livermore National Laboratory & Clark University.

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X-ray structure determination of fully hydrated L alpha phase dipalmitoylphosphatidylcholine bilayers

TL;DR: Comparison with results that were derived from previous neutron diffraction data is excellent, and it is concluded from diffraction studies that AF = 62.9 +/- 1.3 A2, which is in excellent agreement with a previous estimate from NMR data.
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Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders

TL;DR: In this paper, a fast and non-destructive method for generating three-dimensional maps of the grain boundaries in undeformed polycrystals is presented, which relies on tracking of micro-focused high-energy X-rays.
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Interbilayer interactions from high-resolution x-ray scattering

TL;DR: In this paper, high-resolution x-ray scattering data for bilayers composed of three different kinds of phosphatidylcholine lipids is reported, and the functional form determined from experimental data has an exponential decay rather than the power law decay that applies for hard confinement in the large $a$ regime.
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Measurement of chain tilt angle in fully hydrated bilayers of gel phase lecithins

TL;DR: The tilt angle theta tilt of the hydrocarbon chains has been determined for fully hydrated gel phase of a series of saturated lecithins and it is suggested that the headgroup packing is at its excluded volume limit for this range.
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Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification

TL;DR: In this article, a forward modeling method for quantitatively reconstructing the geometry and orientation of microstructural features inside of bulk samples from high-energy x-ray diffraction microscopy data is presented.