R
Rolf Kaufmann
Researcher at Swiss Federal Laboratories for Materials Science and Technology
Publications - 72
Citations - 2031
Rolf Kaufmann is an academic researcher from Swiss Federal Laboratories for Materials Science and Technology. The author has contributed to research in topics: Phase-contrast imaging & Interferometry. The author has an hindex of 22, co-authored 72 publications receiving 1837 citations. Previous affiliations of Rolf Kaufmann include University of Zurich & Paul Scherrer Institute.
Papers
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Proceedings ArticleDOI
An all-solid-state optical range camera for 3D real-time imaging with sub-centimeter depth resolution (SwissRanger)
Thierry Oggier,Michael Lehmann,Rolf Kaufmann,Matthias Schweizer,Michael Richter,Peter Metzler,Graham Lang,Felix Lustenberger,Nicolas Blanc +8 more
TL;DR: The SwissRanger 2 as mentioned in this paper is a 3D camera system based on the time-of-flight (TOF) principle, which can achieve sub-centimeter depth resolution for a wide range of operating conditions.
Journal ArticleDOI
Noise analysis of grating-based x-ray differential phase contrast imaging.
TL;DR: This work reports on the recent development of quantitative descriptions for the stochastic error of grating-based differential phase contrast imaging (DPCi), and finds that the noise in DPCi depends strongly on the phase stepping visibility and the sample properties.
Journal ArticleDOI
High-density electrode array for imaging in vitro electrophysiological activity
Luca Berdondini,P.D. van der Wal,Olivier T. Guenat,N. F. de Rooij,Milena Koudelka-Hep,Peter Seitz,Rolf Kaufmann,Peter Metzler,Nicolas Blanc,Stephan Rohr +9 more
TL;DR: The suitability of the APS concept for developing a new generation of high-resolution extracellular recording devices for in vitro electrophysiology is demonstrated by recording the spontaneous electrical activity of neonatal rat cardiomyocytes.
Journal ArticleDOI
Ultralow dark current Ge/Si(100) photodiodes with low thermal budget
TL;DR: In this paper, vertical incidence photodiodes were fabricated from Ge grown epitaxially on Si(100) by low-energy plasma-enhanced chemical vapor deposition, considering the energy band profiles of n-i p and p-i n heterostructures, and optimization of growth processes and thermal budget.
Journal ArticleDOI
Sub-pixel porosity revealed by x-ray scatter dark field imaging
Vincent Revol,Iwan Jerjen,Christian Kottler,P. Schütz,Rolf Kaufmann,T. Lüthi,Urs Sennhauser,U. Straumann,Claus Urban +8 more
TL;DR: In this paper, it is demonstrated that scatter dark field imaging is particularly adapted to the study of a material's porosity, and an interferometer, optimized for x-ray energies around 50 keV, enables the investigation of aluminum welding with conventional laboratory xray tubes.