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Christian Kottler

Researcher at Paul Scherrer Institute

Publications -  34
Citations -  2280

Christian Kottler is an academic researcher from Paul Scherrer Institute. The author has contributed to research in topics: Phase-contrast imaging & Interferometry. The author has an hindex of 19, co-authored 33 publications receiving 2118 citations.

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Journal ArticleDOI

Hard X-Ray Phase Tomography with Low-Brilliance Sources

TL;DR: This work focuses on how this method can be used for tomographic reconstructions using filtered back projection algorithms to yield quantitative volumetric information of both the real and imaginary part of the samples's refractive index.
Journal ArticleDOI

Fabrication of diffraction gratings for hard X-ray phase contrast imaging

TL;DR: In this article, a method for X-ray phase contrast imaging based on a grating interferometer is proposed. But the method is limited to incoherent radiation from a standard Xray tube.
Journal ArticleDOI

A two-directional approach for grating based differential phase contrast imaging using hard x-rays.

TL;DR: A two-directional approach for grating based x-ray differential phase contrast imaging with particular emphasis on the algorithm for proper phase retrieval to retrieve good quality and artifact-free phase images.
Proceedings ArticleDOI

Tomography with grating interferometers at low-brilliance sources

TL;DR: In this paper, the coherence requirements for efficient operation of an X-ray grating interferometer are discussed, and a Talbot-Lau geometry, in which an array of equidistant secondary sources is used, can be used to decouple fringe visibility in the inter-ferometer (and thus, its efficiency) from the total size of the Xray source.
Journal ArticleDOI

Noise analysis of grating-based x-ray differential phase contrast imaging.

TL;DR: This work reports on the recent development of quantitative descriptions for the stochastic error of grating-based differential phase contrast imaging (DPCi), and finds that the noise in DPCi depends strongly on the phase stepping visibility and the sample properties.