S
S. H. Myers
Researcher at United States Naval Research Laboratory
Publications - 4
Citations - 1060
S. H. Myers is an academic researcher from United States Naval Research Laboratory. The author has contributed to research in topics: Imaging spectrometer & Spectrometer. The author has an hindex of 2, co-authored 3 publications receiving 991 citations.
Papers
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Journal ArticleDOI
The EUV Imaging Spectrometer for Hinode
J. L. Culhane,Louise K. Harra,A. M. James,K. Al-Janabi,L. Bradley,Rifat A Chaudry,Kerrin Rees,J. Tandy,P. D. Thomas,M. C. R. Whillock,Berend Winter,George A. Doschek,Clarence M. Korendyke,Charles M. Brown,S. H. Myers,J. T. Mariska,John F. Seely,J. Lang,B. J. Kent,B. M. Shaughnessy,Peter R. Young,G. M. Simnett,C. M. Castelli,S. Mahmoud,H. Mapson-Menard,Brian J. Probyn,Roger J. Thomas,Joseph M. Davila,Kenneth P. Dere,David L. Windt,John Shea,R. Hagood,Robert W. Moye,Hirohisa Hara,Takashi Watanabe,K. Matsuzaki,Takeo Kosugi,Viggo Hansteen,Ø. Wikstol +38 more
TL;DR: The EUV Imaging Spectrometer (EIS) as mentioned in this paper is a two-element, normal incidence design with a backside-illuminated, thinned CCD, which has a significantly greater effective area than previous orbiting EUV spectrographs with typical active region 2 -5 s exposure times in the brightest lines.
Proceedings ArticleDOI
The Extreme UV Imaging Spectrometer for the JAXA Solar-B Mission
J. L. Culhane,George A. Doschek,Tetsuya Watanabe,Alan Smith,Carl W. Brown,Hirohisa Hara,Louise K. Harra,A. M. James,K. Al Janabi,B. J. Kent,Clarence M. Korendyke,J. Lang,John T. Mariska,S. H. Myers,John F. Seely,G. Simnett,J. Tandy,Roger J. Thomas,David L. Windt +18 more
TL;DR: The Extreme-UV Imaging Spectrometer (EISASV) was used in the ISAS/JAXA Solar-B mission as mentioned in this paper to detect photons in the wavelength ranges 17 - 21 nm and 25 - 29 nm.
Journal Article
Expected performance of the extreme ultraviolet imaging spectrometer on Solar-B
John T. Mariska,Charles M. Brown,Kenneth P. Dere,G. A. Doschek,Clarence M. Korendyke,S. H. Myers,John F. Seely,J. L. Culhane,T. Watanabe +8 more
Journal ArticleDOI
Influence of Laser Processing Parameters on the Density-Ductility Tradeoff in Additively Manufactured Pure Tantalum
TL;DR: In this article , the authors investigate the AM processing parameters for pure tantalum (Ta) and understand their influence on the attendant properties, finding that a balance between maximizing bulk material density and minimizing steep thermal gradients during processing is needed to optimize the strength-ductility tradeoff.