S
S. J. Martin
Researcher at Dow Chemical Company
Publications - 9
Citations - 1551
S. J. Martin is an academic researcher from Dow Chemical Company. The author has contributed to research in topics: Dielectric & Polymer. The author has an hindex of 8, co-authored 9 publications receiving 1471 citations.
Papers
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Journal ArticleDOI
Dendritic macromolecules: synthesis of starburst dendrimers
Donald A. Tomalia,H. Baker,James R Dewald,Michael B. Hall,G. Kallos,S. J. Martin,J. Roeck,J. Ryder,Patrick B. Smith +8 more
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Development of a Low‐Dielectric‐Constant Polymer for the Fabrication of Integrated Circuit Interconnect
TL;DR: SiLK resin this article is a solution of a low-molecular-weight aromatic thermosetting polymer, which is used in the fabrication of interconnect structures such as the one shown in the Figure.
Journal ArticleDOI
Benzocyclobutene (DVS-BCB) polymer as an interlayer dielectric (ILD) material
TL;DR: In this paper, the DVS-BCB (CYCLOTENETM 5021) material is used to fill 0.20 μm gaps at 5:1 aspect ratios.
A New Class of Polymers : Starbust-Dendritic Macromolecules
Donald A. Tomalia,H. Baker,James R Dewald,M.G.K. Hall,S. J. Martin,J. Roek,J. Ryder,Patrick B. Smith,G. Kallos +8 more
TL;DR: Starburst polymers as discussed by the authors are a class of topological macromolecules which are derived from classical monomers/oligomers by their extraordinary symmetry, high branching and maximized terminal functionality density.
Journal ArticleDOI
Silk Polymer Coating with Low Dielectric Constant and High Thermal Stability for Ulsi Interlayer Dielectric
Paul H. Townsend,S. J. Martin,James P. Godschalx,D. R. Romer,Dennis W. Smith,D. Castillo,Robert A. DeVries,Gary R. Buske,Nelson G. Rondan,Steve Froelicher,J. Marshall,E. O. Shaffer,Jang-Hi Im +12 more
TL;DR: In this article, a novel polymer is developed for use as a thin film dielectric in the interconnect structure of high density integrated circuits, which is applied to the substrate as an oligomeric solution, SiLK, using conventional spin coating equipment and produces highly uniform films after curing at 400 °C to 450 °C.