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Saibal Basu

Researcher at Homi Bhabha National Institute

Publications -  92
Citations -  1251

Saibal Basu is an academic researcher from Homi Bhabha National Institute. The author has contributed to research in topics: Neutron reflectometry & Thin film. The author has an hindex of 18, co-authored 90 publications receiving 1065 citations. Previous affiliations of Saibal Basu include National Institute of Standards and Technology & Bhabha Atomic Research Centre.

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Structural correlations in GexSe1−x glasses – a neutron diffraction study

TL;DR: In this article, the first sharp diffraction peak (FSDP) in the structure factor, S(Q), shows a systematic increase in the intensity and shifts to a lower Q with increasing Ge concentration.
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Resonant soft x-ray reflectivity of organic thin films

TL;DR: In this paper, a resonant soft x-ray reflectivity (RSoXR) approach was proposed to enhance and tune the contrast in reflectivity experiments of organic films.
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Fast Response and High Sensitivity of ZnO Nanowires-Cobalt Phthalocyanine Heterojunction Based H2S Sensor.

TL;DR: The detailed XPS analysis suggests that these heterojunction films with 25 nm thick CoPc exhibit the least content of chemisorbed oxygen, enabling the direct interaction of H2S with the CoP c molecule, and therefore exhibit the fastest response.
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A new polarized neutron reflectometer at Dhruva for specular and off-specular neutron reflectivity studies

TL;DR: In this article, a polarized neutron reflectometer for vertical sample geometry has been installed in the guide tube laboratory of the Trombay nuclear power plant at TromBay, India, where it uses a monochromatic neutron beam of 2.5 A in a step scan mode with a linear position sensitive detector.