scispace - formally typeset
S

Salman Iqbal

Researcher at GlobalFoundries

Publications -  6
Citations -  33

Salman Iqbal is an academic researcher from GlobalFoundries. The author has contributed to research in topics: Interferometry & Diffraction grating. The author has an hindex of 4, co-authored 6 publications receiving 33 citations.

Papers
More filters
Journal ArticleDOI

Measurement accuracy of lateral-effect position-sensitive devices in presence of stray illumination noise

TL;DR: In this paper, the presence of the spurious sources modifies the measurement accuracy of these detectors and the experimental results obtained for the position measurement accuracy were compared with the results from the proposed mathematical model and it was seen that measured accuracy is within a fraction of a percent of the calculated one.
Journal ArticleDOI

Multipoint diffraction strain sensor: theory and results

TL;DR: In this article, a multi-point diffraction strain sensor was developed using a moire interferometer with the added feature of whole-field strain determination, which was implemented by simultaneous tracking of sampled wavefront diffracted from the component under test.
Journal ArticleDOI

Characterization of multipoint diffraction strain and tilt sensor based on moiré interferometer and multichannel imaging position-sensitive detector

TL;DR: In this article, a multichannel imaging position-sensitive detector has been developed and characterized, with the novel feature of simultaneous measurement of strain and tilt at a large array of points, using principles of diffraction to directly measure strain at the desired points.
Proceedings ArticleDOI

Investigation of trench and contact hole shrink mechanism in the negative tone develop process

TL;DR: In this article, the trench and contact hole shrink mechanism in negative tone develop resist processes and its manufacturability challenges associated for 20nm technology nodes and beyond are studied in detail, and the impact of time link delay on resolved critical dimension (CD) is fully characterized for patterned resist and etched geometries as a function of various process changes.
Proceedings ArticleDOI

Multipoint Diffraction Strain Sensor : an add-on to moiré interferometer

TL;DR: In this paper, a multipoint diffraction sensor was developed based on a normal moire interferometer, with the novel feature of whole field strain determination, along with the possibility of rotation and tilt determination.