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Sanjib Chatterjee

Researcher at Raja Ramanna Centre for Advanced Technology

Publications -  46
Citations -  284

Sanjib Chatterjee is an academic researcher from Raja Ramanna Centre for Advanced Technology. The author has contributed to research in topics: Interferometry & Wavefront. The author has an hindex of 9, co-authored 46 publications receiving 262 citations. Previous affiliations of Sanjib Chatterjee include Indian Department of Atomic Energy.

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Application of Newton's method to determine the focal length of lenses using a lateral shearing interferometer and cyclic path optical configuration setup

TL;DR: In this paper, a cyclic path optical configuration (CPOC) and a wedge shear plate (WSP) were used for the measurement of the focal length of a doublet lens.
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Simple technique for the generation of white light Young's fringes with a cyclic optical configuration

TL;DR: A new (to the authors' knowledge) technique for the generation of white light Young's type fringes using a cyclic path optical configuration is presented and the effect of the size of an incoherent broadband light source on the fringe visibility is discussed.
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Measurement of longitudinal displacement using lateral shearing cyclic path optical configuration setup and phase shifting interferometry

TL;DR: A technique for the measurement of longitudinal displacement using a lateral shearing cyclic path optical configuration (CPOC) setup and phase shifting interferometry, which can be used for an extended range of distance measurement.
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Measurement of the surface profile of an axicon lens with a polarization phase-shifting shearing interferometer

TL;DR: The Twyman-Green interferometer (TGI)-based polarization phase-shifting shearing interferometric technique for testing the conical surface of an axicon (AX) lens gives a map of the optical path difference (OPD) between two successive close points along a radial direction on the conICAL surface of the AX lens.
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Measurement of surface profile of a long-radius optical surface with wedge phase shifting lateral shear interferometer

TL;DR: In this paper, a phase shifting lateral shearing interferometer is used for the measurement of the surface profile of optical surfaces of long radius of curvature of beam line mirrors of synchrotron radiation sources.