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Sebastian Gabmeyer

Researcher at Technische Universität Darmstadt

Publications -  24
Citations -  348

Sebastian Gabmeyer is an academic researcher from Technische Universität Darmstadt. The author has contributed to research in topics: Model checking & Dram. The author has an hindex of 10, co-authored 24 publications receiving 277 citations. Previous affiliations of Sebastian Gabmeyer include Vienna University of Technology.

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Book ChapterDOI

Run-Time Accessible DRAM PUFs in Commodity Devices

TL;DR: This paper is the first to enable the run-time access of decay-based intrinsic DRAM PUFs in commercial off-the-shelf systems, which requires no additional hardware or FPGA implementations for their operation.
Proceedings ArticleDOI

Intrinsic Rowhammer PUFs: Leveraging the Rowhammer effect for improved security

TL;DR: This work presents a new type of a memory-based intrinsic PUF, which leverages the Rowhammer effect in DRAM modules to design a novel PUF that makes use of bit flips, which occur inDRAM cells due to rapid and repeated access of DRAM rows.
Proceedings ArticleDOI

SCAPI: a scalable attestation protocol to detect software and physical attacks

TL;DR: This paper presents the first scalable attestation protocol that detects physical attacks, based on the assumption that physical attacks require an adversary to capture and disable devices for a noticeable amount of time, and reduces communication complexity and runtimes by orders of magnitude and precisely identifies compromised devices.
Journal ArticleDOI

Decay-Based DRAM PUFs in Commodity Devices

TL;DR: This paper focuses on a new class of run-time accessible, decay-based, intrinsic DRAM PUFs in commercial off-the-shelf systems, which requires no additional hardware or FPGA implementation for their operation.
Proceedings ArticleDOI

Low-Temperature Data Remanence Attacks Against Intrinsic SRAM PUFs

TL;DR: In this paper, the authors presented the first systematic study of data remanence effects on an intrinsic Static Random Access Memory Physical Unclonable Function (SRAM PUF) implemented on a commercial off-the-shelf (COTS) device in the temperature range between −110 degrees Celsius and −40 degrees Celsius.