S
Shilu Tian
Researcher at Chinese Academy of Sciences
Publications - 12
Citations - 120
Shilu Tian is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Thin film & Ferroelectricity. The author has an hindex of 5, co-authored 11 publications receiving 71 citations.
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Journal ArticleDOI
Switchable ferroelectric diode and photovoltaic effects in polycrystalline BiFeO3 thin films grown on transparent substrates
Yong Zhou,Can Wang,Shilu Tian,Xiaokang Yao,Chen Ge,Er-Jia Guo,Meng He,Guozhen Yang,Kuijuan Jin +8 more
TL;DR: In this article, a polycrystalline BiFeO3 (BFO) thin film on a transparent substrate also has the ferroelectric switchable diode and photovoltaic effects.
Journal ArticleDOI
Manipulating the Ferroelectric Domain States and Structural Distortion in Epitaxial BiFeO3 Ultrathin Films via Bi Nonstoichiometry.
Shilu Tian,Can Wang,Yong Zhou,Xiaomei Li,Peng Gao,Jiesu Wang,Yu Feng,Xiaokang Yao,Chen Ge,Meng He,Xuedong Bai,Guozhen Yang,Kuijuan Jin +12 more
TL;DR: Atomic-scale structural and chemical characterizations and second-harmonic generation measurements reveal that two different kinds of structural distortions and interface atomic configurations in the BFO/LSMO heterostructures can be induced by the change of Bi nonstoichiometry, leading to the two opposite as-grown ferroelectric polarizations.
Journal ArticleDOI
Internal Electric Field and Polarization Backswitching Induced by Nb Doping in BiFeO3 Thin Films
Yong Zhou,Can Wang,Xiaojie Lou,Shilu Tian,Xiaokang Yao,Chen Ge,Er-Jia Guo,Meng He,Guozhen Yang,Kuijuan Jin +9 more
TL;DR: In this article, an effective internal electric field induced by Nb doping in BiFeO3 (BFO) thin films and the consequent effects on polarization backswitching and conduction behaviors were reported.
Journal ArticleDOI
Effects of BaTiO 3 and SrTiO 3 as the buffer layers of epitaxial BiFeO 3 thin films
TL;DR: In this article, X-ray diffraction measurements show that the BTO buffer causes tensile strain in the BFO films, whereas the STO buffer causes compressive strain.
Journal ArticleDOI
Large g factor in bilayer WS2 flakes
S. S. Sun,Yang Yu,Jianchen Dang,Kai Peng,Xin Xie,Feilong Song,Chenjiang Qian,Shiyao Wu,Hassan Ali,Jing Tang,Jingnan Yang,Shan Xiao,Shilu Tian,Meng Wang,Xinyan Shan,Muhammad Rafiq,Can Wang,Xiulai Xu +17 more
TL;DR: In this article, the authors reported a remarkable valley Zeeman effect exhibited by the splitting of excitonic emission in a bilayer WS2, with a value of g factor as large as −16.5.