S
Sijin Wu
Researcher at Beijing Information Science & Technology University
Publications - 48
Citations - 447
Sijin Wu is an academic researcher from Beijing Information Science & Technology University. The author has contributed to research in topics: Speckle pattern & Interferometry. The author has an hindex of 9, co-authored 38 publications receiving 324 citations. Previous affiliations of Sijin Wu include Oakland University & Beijing Jiaotong University.
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Review of electronic speckle pattern interferometry (ESPI) for three dimensional displacement measurement
TL;DR: A review of the recent developments in ESPI systems for 3D displacement and strain measurement can be found in this article, where the basic theory, a brief derivation and different optical layouts are presented.
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Digital Shearography for NDT: Phase Measurement Technique and Recent Developments
TL;DR: Digital shearography is one of the most sensitive and accurate methods for non-destructive testing of composite structures as discussed by the authors, which can directly measure strain with high sensitivity when combined with different optical setups, phase shift techniques, and algorithms.
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Real-time monitoring of phase maps of digital shearography
TL;DR: Quantitative and real-time monitoring of full-field strain information, using different algorithms, is presented and the potentials and limitations for each algorithm are discussed and demonstrated through examples of shearographic testing.
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Enlarging the angle of view in Michelson-interferometer-based shearography by embedding a 4f system.
TL;DR: This work demonstrates a novel digital shearography system with a large angle of view in the optical arrangement, where the imaging lens is in front of the Michelson interferometer rather than behind it as in traditional digitalShearography.
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Digital shearography with in situ phase shift calibration
TL;DR: In this paper, a Michelson-interferometer-based digital shearographic setup with an in situ phase shift calibration is introduced, where a small number of optical parts are introduced into the existing Michelson interferometer to carry out the in situ calibration of the phase shifter.