S
Stavros Nicolopoulos
Researcher at Polytechnic University of Valencia
Publications - 94
Citations - 2219
Stavros Nicolopoulos is an academic researcher from Polytechnic University of Valencia. The author has contributed to research in topics: Electron diffraction & Precession electron diffraction. The author has an hindex of 22, co-authored 87 publications receiving 1981 citations. Previous affiliations of Stavros Nicolopoulos include Polytechnic University of Puerto Rico & Spanish National Research Council.
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Journal ArticleDOI
Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
Edgar F. Rauch,Joaquin Portillo,Stavros Nicolopoulos,Daniel Bultreys,Sergei Rouvimov,Peter Moeck +5 more
TL;DR: In this paper, an automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns.
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Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results
D Viladot,Muriel Véron,Mauro Gemmi,Francesca Peiró,J. Portillo,Sònia Estradé,Joan Mendoza,Núria Llorca-Isern,Stavros Nicolopoulos +8 more
TL;DR: A review on several application examples relative to the characterization of microstructure/microtexture of nanocrystalline metals, ceramics, nanoparticles, minerals and organics.
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High spatial resolution semi-automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes
Peter Moeck,Sergei Rouvimov,Edgar F. Rauch,Muriel Véron,Holm Kirmse,Ines Häusler,Wolfgang Neumann,Daniel Bultreys,Y. Maniette,Stavros Nicolopoulos +9 more
TL;DR: In this paper, a semi-automatic technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is described, based primarily on the projected reciprocal lattice geometry, but also utilizes the intensity of reflections that are extracted from precessionenhanced electron diffraction spot patterns of polycrystalline materials and multi-material composites.
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Ab initio structure determination of nanocrystals of organic pharmaceutical compounds by electron diffraction at room temperature using a Timepix quantum area direct electron detector
E. van Genderen,E. van Genderen,M. T. B. Clabbers,M. T. B. Clabbers,Partha Pratim Das,Andrew Stewart,Igor Nederlof,K. C. Barentsen,Q. Portillo,Navraj S. Pannu,Stavros Nicolopoulos,Tim Gruene,Jan Pieter Abrahams,Jan Pieter Abrahams,Jan Pieter Abrahams +14 more
TL;DR: A specialized quantum area detector for electron diffraction studies makes it possible to solve the structure of small organic compound nanocrystals in non-cryo conditions by direct methods.
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Fast electron diffraction tomography
Mauro Gemmi,Mari Grazia Immacolata La Placa,Athanassios S. Galanis,Edgar F. Rauch,Stavros Nicolopoulos +4 more
TL;DR: In this article, a fast and fully automatic procedure for collecting electron diffraction tomography data is presented, in which the missing wedge of the reciprocal space between the patterns is recorded by longer exposures during the crystal tilt, and automatic data collection of limited tilt range can be used to determine the unitcell parameters, while data of larger tilt range are suitable to solve the crystal structure ab initio with direct methods.