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Stefan Seeger

Researcher at University of Zurich

Publications -  272
Citations -  11849

Stefan Seeger is an academic researcher from University of Zurich. The author has contributed to research in topics: Fluorescence spectroscopy & Silicone. The author has an hindex of 44, co-authored 254 publications receiving 10095 citations. Previous affiliations of Stefan Seeger include Bundesanstalt für Materialforschung und -prüfung & University of Freiburg.

Papers
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Proceedings ArticleDOI

Highly efficient optical detection of surface-generated fluorescence

TL;DR: It is demonstrated that with this simple system an extremely high light collection efficiency can be achieved, without using sophisticated and expensive objectives with high numerical aperture.
Journal ArticleDOI

A superoleophobic textile repellent towards impacting drops of alkanes

TL;DR: In this article, a commercially available polyester fabric has been rendered superoleophobic by coating with silicone nanofilaments and subsequent plasma fluorination and the treated samples show outstanding oil-repellency.
Journal ArticleDOI

XRF-analysis of fine and ultrafine particles emitted from laser printing devices.

TL;DR: It is concluded that solid inorganic particles contribute to LPD emissions in measurable quantities and for the first time Br was detected in significant concentrations in the aerosol emitted from two LPD.
Journal ArticleDOI

Fluorescence pattern recognition for ultrasensitive molecule identification: comparison of experimental data and theoretical approximations

TL;DR: In this paper, the Kullback-Leibler minimum discrimination information was applied to detect dye molecules with nearly identical absorption and emission properties but with different fluorescence lifetimes.
Journal ArticleDOI

Nanometer axial resolution by three-dimensional supercritical angle fluorescence microscopy.

TL;DR: A noninvasive fluorescence microscopy method based on the influence of the microscope slide on the angular intensity distribution of fluorescence is reported and nanometer resolution along the optical axis is demonstrated.