There is, I think, something ethereal about i —the square root of minus one. I remember first hearing about it at school. It seemed an odd beast at that time—an intruder hovering on the edge of reality.

Usually familiarity dulls this sense of the bizarre, but in the case of i it was the reverse: over the years the sense of its surreal nature intensified. It seemed that it was impossible to write mathematics that described the real world in …

I and i

International Technology Roadmap for Semiconductors 2003の要求清浄度について － シリコンウエハ表面と雰囲気環境に要求される清浄度, 分析方法の現状について －

IEEE transactions on computer-aided design of integrated circuits and systems : a publication of the IEEE Circuits and Systems Society

Preparing the books to read every day is enjoyable for many people. However, there are still many people who also don't like reading. This is a problem. But, when you can support others to start reading, it will be better. One of the books that can be recommended for new readers is computer aided analysis of electronic circuits algorithms and computational techniques. This book is not kind of difficult book to read. It can be read and understand by the new readers.

Computer-aided analysis of electronic circuits: Algorithms and computational techniques

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in safety-critical biomedical applications, dependability emerges as a critical performance parameter. In this paper, we present a costeffective concurrent test methodology for droplet-based microelectrofluidic systems. We present a classification of catastrophic and parametric faults in such systems and show how faults can be detected by electrostatically controlling and tracking droplet motion. We then present tolerance analysis based on Monte-Carlo simulations to characterize the impact of parameter variations on system performance. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for droplet-based microelectrofluidic systems.

/pdf/testing-of-droplet-based-microelectrofluidic-systems-18awwzf2yt.pdf

Testing of droplet-based microelectrofluidic systems

In this paper, we present a hardware technique, called self-repairing array structures (SRAS), for masking hard faults in microprocessor array structures, such as the reorder buffer and branch history table. SRAS masks errors that could otherwise lead to slow system recoveries. To detect row errors, every write to a row is mirrored to a dedicated "check row". We then read out both the written row and check row and compare their results. To correct errors, SRAS maps out faulty array rows with a level of indirection.

/pdf/tolerating-hard-faults-in-microprocessor-array-structures-5co2dh1d4y.pdf

Tolerating hard faults in microprocessor array structures

We develop a microprocessor design that tolerates hard faults, including fabrication defects and in-field faults, by leveraging existing microprocessor redundancy. To do this, we must: detect and correct errors, diagnose hard faults at the field deconfigurable unit (FDU) granularity, and deconfigure FDUs with hard faults. In our reliable microprocessor design, we use DIVA dynamic verification to detect and correct errors. Our new scheme for diagnosing hard faults tracks instructions' core structure occupancy from decode until commit. If a DIVA checker detects an error in an instruction, it increments a small saturating error counter for every FDU used by that instruction, including that DIVA checker. A hard fault in an FDU quickly leads to an above-threshold error counter for that FDU and thus diagnoses the fault. For deconfiguration, we use previously developed schemes for functional units and buffers, and we present a scheme for deconfiguring DIVA checkers. Experimental results show that our reliable microprocessor quickly and accurately diagnoses each hard fault that is injected and continues to function, albeit with somewhat degraded performance.

/pdf/a-mechanism-for-online-diagnosis-of-hard-faults-in-2yevr8yidk.pdf

A Mechanism for Online Diagnosis of Hard Faults in Microprocessors

Recent events have heightened the need for fast, accurate, and reliable biological/chemical sensor systems for critical locations. As droplet-based microelectrofluidic sensor systems become widespread in these safety-critical biomedical applications, reliability emerges as a critical performance parameter. In order to ensure the operational health of such safety-critical systems, they need to be monitored for defects, not only after manufacturing, but also during in-field operation. In this paper, we present a cost-effective concurrent test methodology for droplet-based microelectrofluidic systems. We present a classification of catastrophic and parametric faults in such systems and show how faults can be detected by electrostatically controlling and tracking droplet motion. We then present a fault simulation approach based on tolerance analysis using Monte-Carlo simulation to characterize the impact of parameter variations on system performance. Finally, we present experimental results on a droplet-based microelectrofluidic system for a real-time polymerase chain reaction application.

/pdf/ensuring-the-operational-health-of-droplet-based-2luuocfxwj.pdf

Ensuring the operational health of droplet-based microelectrofluidic biosensor systems

Recent years have seen the emergence of droplet-based microfluidic systems for safety-critical biomedical applications. In order to ensure reliability, microsystems incorporating microfluidic components must be tested adequately. In this paper, we investigate test planning and test resource optimization for droplet-based microfluidic arrays. We first formulate the test planning problem and prove that it is NP-hard. We then describe an optimization method based on integer linear programming (ILP) that yields optimal solutions. Due to the NP-hard nature of the problem, we develop heuristic approaches for optimization. Experimental results indicate that for large array sizes, the heuristic methods yield solutions that are close to provable lower bounds. These heuristics ensure scalability and low computation cost.

/pdf/test-planning-and-test-resource-optimization-for-droplet-4eodrwmr5b.pdf

Sule Ozev

Papers

Testing of droplet-based microelectrofluidic systems

Tolerating hard faults in microprocessor array structures

A Mechanism for Online Diagnosis of Hard Faults in Microprocessors

Ensuring the operational health of droplet-based microelectrofluidic biosensor systems

Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems