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T. Laska

Researcher at Siemens

Publications -  19
Citations -  669

T. Laska is an academic researcher from Siemens. The author has contributed to research in topics: Short circuit & Power semiconductor device. The author has an hindex of 11, co-authored 19 publications receiving 639 citations.

Papers
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Proceedings ArticleDOI

The Field Stop IGBT (FS IGBT). A new power device concept with a great improvement potential

TL;DR: In this paper, a vertical shrink of the NPT IGBT to a structure with a thin n/sup -/ base and a low doped field stop layer was proposed.
Patent

Bipolar transistor which can be controlled by field effect and method for producing the same

TL;DR: In this article, a field-effect controlled vertical bipolar transistor with Schottky contact with a disturbed pre-layer is described, where at least one supply connection is set up on a first face of the substrate.
Proceedings ArticleDOI

Short circuit properties of Trench-/Field-Stop-IGBTs-design aspects for a superior robustness

TL;DR: In this paper, the authors discuss the different principal short circuit failure modes of IGBTs focusing on the new Trench-/Field-Stop-IGBT device concept, and a new failure mode, the so called short circuit current destruction mode, is described.
Proceedings ArticleDOI

1200 V-trench-IGBT study with square short circuit SOA

TL;DR: In this paper, the authors discuss the design of a new 1200 V trench IGBT structure, which combines the combination of well-designed trench cell geometry and a favourably adjusted vertical carrier concentration profile, leading to a trench-IGBT chip with both low static and dynamic losses and a degree of ruggedness similar to state-of-the-art planar cell nonpunch-through (NPT) IGBTs.
Proceedings ArticleDOI

Ultra thin-wafer technology for a new 600 V-NPT-IGBT

TL;DR: In this paper, the method of manufacturing 100 /spl mu/m thin IGBT wafers is described, and the key topic of new deposition processes reducing the bow of very thin wafer is discussed as well as improvements in equipment and wafer handling.