II. Structure of Perovskites 1982 A. Crystal Structure 1982 B. Nonstoichiometry in Perovskites 1983 1. Oxygen Nonstoichiometry 1983 2. Cation Nonstoichiometry 1984 C. Physical Properties 1985 D. Adsorption Properties 1986 1. CO and NO Adsorption 1986 2. Oxygen Adsorption 1987 E. Specific Surface and Porosity 1987 F. Thermal Stability in a Reducing Atmosphere 1989 III. Acid−Base and Redox Properties 1990 A. Acidity and Basicity 1990 B. Redox Processes 1991 1. Kinetics and Mechanisms 1992 2. Reduction−Oxidation Cycles 1993 C. Ion Mobility 1993 1. Oxygen Transport 1993 2. Cation Transport 1994 IV. Heterogeneous Catalysis 1995 A. Oxidation Reactions 1995 1. CO Oxidation 1995 2. Oxidation of Hydrocarbons 1996 B. Pollution Abatement 2001 1. NOx Decomposition 2001 2. Exhaust Treatment 2002 3. Stability 2004 C. Hydrogenation and Hydrogenolysis Reactions 2004 1. Hydrogenation of Carbon Oxides 2004 2. Hydrogenation and Hydrogenolysis Reactions 2006

Chemical structures and performance of perovskite oxides.

A new empirical study of the relation between money, nominal income, prices, and real output in postwar quarterly U.S. data rejects virtually all of the conclusions reached by Families provide individuals with risk sharing opportunities which may not otherwise be available. Within the family there is a degree of trust and a level of information which alleviates three key problems in the provision of insurance by markets open to the general public, namely, moral hazard, adverse selection, and deception. The informational advantages of pooling risk within families must be set against the inability of families to provide complete insurance because of the small size of the risk pooling group. This paper demonstrates how families can provide insurance against uncertain dates of death. Death risk sharing family arrangements effectively constitute an incomplete annuities market. Our analysis indicates that these arrangements even in small families can substitute by more than70% for complete annuities. Given the adverse selection problem and transactions costs in public annuity markets, risk pooling in families may well be preferred to purchasing market annuities. In the absence of organized public markets in annuities, these risk sharing arrangements provide powerful economic incentives for marriage and family formation. The paper suggests that inter-family transfers need have nothing to do with altruistic feelings; rather, they may simply reflect risk sharing behavior of completely selfish family members.(This abstract was borrowed from another version of this item.)(This abstract was borrowed from another version of this item.)(This abstract was borrowed from another version of this item.)(This abstract was borrowed from another version of this item.)(This abstract was borrowed from another version of this item.)(This abstract was borrowed from another version of thi(This abstract was borrowed from another version of this item.)

The Family as an Incomplete Annuities Market

1.1. Mass Spectrometry
A mass spectrometer is described as the smallest weighing scale in the world ever used.1 Mass spectrometry (MS) is a unique technique that has an interdisciplinary nature, which freely crosses the borders of physics, chemistry and biology. Mass spectrometry makes a great scientific tool due to its capabilities to determine the mass of large biomolecular complexes, individual biomolecules, small organic molecules as well as single atoms and their isotopes. Right from the time of its invention in the first decade of the 20th century, mass spectrometry has undergone tremendous improvements in terms of its sensitivity, resolution and mass range. It currently finds applications in all scientific disciplines such as chemistry, physics, biology, pharmacology, medicine, biochemistry and bio-agro-based industry.

Introduction of “soft” ionization sources such as electrospray ionization (ESI) by J.B. Fenn et al.2 and matrix-assisted laser desorption/ionization (MALDI) by M. Karas et al.3 in 1980s revolutionized mass spectrometry as it offered the capability to analyze large intact biomolecules. As such MS became an irreplaceable tool for the biological sciences. The development of both ESI and MALDI made possible the ionization of smaller biomolecules such as drugs and metabolites as well larger biomolecules such as lipids, peptides and even proteins.2,4 The molecular weight (Mw) ranges we use in this review are defined as follows. The low Mw range includes elements and molecules from 1 to 500 Da. Molecules with Mw between 500 and 2000 Da fall in the medium Mw range. All molecules with Mw > 2000 Da are considered to be part of the high molecular weight class. It goes beyond the scope of this review to cover all developments in MS. Rather this review focuses on one of the latest, rapidly developing innovations in MS namely mass spectrometric imaging (MSI). This young technique takes benefit from all methodological and technological developments in general MS over the last decades. Over the last twenty years MSI has transformed from an esoteric, specialist technology studied by few researchers only to a technique that now finds itself at the center stage of mainstream MS. Over the last years the technology has matured to find applications in many different areas, with instrument developments taken up by all MS instrument manufacturers resulting in a rapid rise of the number of research groups active in this area. A thorough review of the area is therefore timely and needed to offer a starting point for all newcomers to the field. In this paper we describe and review approximately 20 years of MSI developement from the perspective of its application to biomedical imaging. We will emphasize the key research steps and pitfalls that determine the outcome of biological applications of this relatively new label free biomolecular imaging technique in life sciences.

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Mass spectrometric imaging for biomedical tissue analysis.

This paper discusses the principles and experimental status of gas cluster ion beam (GCIB) processing as a promising surface modification technique for practical industrial applications. Theoretical and experimental characteristics of GCIB processes and of related equipment development are described from the moment of neutral cluster formation, through ionization, acceleration and impact upon a surface. The impact of an accelerated cluster ion upon a target surface imparts very high energy densities into the impact area and produces non-linear effects that are not observed in the impacts of atomic ions. Unique characteristics of GCIB bombardment have been found to offer potential for various industrial applications that cannot be achieved by conventional ion beam processing. Among prospective applications are included shallow ion implantation, high rate sputtering, surface cleaning and smoothing, and low temperature thin film formation. Sputtering effects produced by cluster ion impact are particularly interesting. High sputtering yields and lateral distribution of sputtered atoms cause surface smoothing effects which cannot be achieved with monomer ion beams. Surface smoothing to atomic levels is expected to become the first production use of GCIB.

Materials Processing by Gas Cluster Ion Beams

This paper presents new empirical evidence in support of the view that a significant fraction of total saving is motivated solely by the desire to leave bequests. Specifically, I find that Social Security annuity benefits significantly raise life insurance holdings and depress private annuity holdings among elderly individuals. These patterns indicate that the typical household would choose to maintain a positive fraction of its resources in bequeathable forms, even if insurance markets were perfect. Evidence on the relationship between insurance purchases and total resources reinforces this conclusion.

How Strong are Bequest Motives? Evidence Based on Estimates of the Demand for Life Insurance and Annuities

We demonstrate depth profiling of polymer materials by using large argon (Ar) cluster ion beams. In general, depth profiling with secondary ion mass spectrometry (SIMS) presents serious problems in organic materials, because the primary keV atomic ion beams often damage them and the molecular ion yields decrease with increasing incident ion fluence. Recently, we have found reduced damage of organic materials during sputtering with large gas cluster ions, and reported on the unique secondary ion emission of organic materials. Secondary ions from the polymer films were measured with a linear type time-of-flight (TOF) technique; the films were also etched with large Ar cluster ion beams. The mean cluster size of the primary ion beams was Ar 700 and incident energy was 5.5 keV. Although the primary ion fluence exceeded the static SIMS limit, the molecular ion intensities from the polymer films remained constant, indicating that irradiation with large Ar cluster ion beams rarely leads to damage accumulation on the surface of the films, and this characteristic is excellently suitable for SIMS depth profiling of organic materials.

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.

We propose to use cluster ions that are much larger than the molecular ions as primary ions for organic secondary ion mass spectrometry. Incident Ar cluster ion beams with energies from 10 to 20 keV and a mean size of about 1000 atoms/cluster were used. Secondary ions were measured for a thin arginine film target (200 nm) bombarded with large Ar cluster ions using a time-of-flight technique. Molecular ions of arginine and characteristic fragment ions were detected with high sensitivity. When large Ar cluster ions such as Ar1500 were incident on the arginine target, molecular ions of arginine were detected with little fragment ions. This indicates that large cluster ions can ionize arginine molecules without damaging them.

Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions

In this study, we present molecular depth profiling of multilayer structures composed of organic semiconductor materials such as tris(8-hydroxyquinoline)aluminum (Alq3) and 4,4′-bis[N-(1-naphthyl)-N-phenylamino]biphenyl (NPD). Molecular ions produced from Alq3 and NPD were measured by linear-type time-of-flight (TOF) mass spectrometry under 5.5 keV Ar700 ion bombardment. The organic multilayer films were analyzed and etched with large Ar cluster ion beams, and the interfaces between the organic layers were clearly distinguished. The effect of temperature on the diffusion of these materials was also investigated by the depth profiling analysis with Ar cluster ion beams. The thermal diffusion behavior was found to depend on the specific materials, and the diffusion of Alq3 molecules was observed to start at a lower temperature than that of NPD molecules. These results prove the great potential of large gas cluster ion beams for molecular depth profiling of organic multilayer samples. Copyright © 2009 John Wiley & Sons, Ltd.

Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

The irradiation of a surface with a cluster ion beam is known to give superior surface modification effects compared with monomer ions. Surface smoothing processes and sputtering yield are both better off. The irradiation process by cluster ions has proved to be quite different from that by monomer ions. We have examined the process of cluster impacts on a solid surface by molecular dynamics simulation to investigate these differences. We simulated an Ar cluster, with size from 13 to 3000 atoms, impacting on a Si(100) substrate, with acceleration energies from 0.5 keV to 55 keV. The Ar cluster atoms penetrate into the Si substrate keeping the cluster state, and the penetration depth is deeper than that of a monomer ion of the same velocity. Si atoms around the Ar cluster are displaced, some of them recover, and the Ar atoms of the cluster are reflected back into the vacuum. Consequently, the displaced Si atoms concentrate in a shallow surface area, and crater-like damage remains. The radius and the depth of the crater are almost the same and are proportional to the cube root of the acceleration energy of the cluster ion. This means that the peculiar damage formation process, created by a cluster ion impact, is caused by an isotropic energy transportation through many interactions between cluster and surface atoms.

Molecular dynamics simulation of damage formation by cluster ion impact

This paper describes the fundamental principles and experimental status of gas cluster ion beam (GCIB) processing as a new technique with promise for practical industrial applications. A review is presented of the theoretical and experimental characteristics of new gas cluster ion bombardment processes and of related equipment development. The impacts of accelerated cluster ions upon substrate surfaces impart very high-energy densities in the impact regions of individual clusters and produce non-linear processes that are not present in the impacts of individual atomic ions. These unique bombardment characteristics are expected to facilitate new industrial applications that would not be possible by traditional ion beam processing. Among these are shallow ion implantation, high rate sputtering, surface cleaning and smoothing, and low-temperature thin film formation.

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Takaaki Aoki

Papers

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.

Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions

Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

Molecular dynamics simulation of damage formation by cluster ion impact

Nano-Processing with Gas Cluster Ion Beams