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Takashi Tokizaki

Researcher at National Institute of Advanced Industrial Science and Technology

Publications -  34
Citations -  419

Takashi Tokizaki is an academic researcher from National Institute of Advanced Industrial Science and Technology. The author has contributed to research in topics: Near-field scanning optical microscope & Optical microscope. The author has an hindex of 9, co-authored 34 publications receiving 413 citations.

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Subpicosecond time response of third‐order optical nonlinearity of small copper particles in glass

TL;DR: Femtosecond pump-probe experiments with a time resolution of 100 fs have been performed for copper particles with a radius of 4 nm as mentioned in this paper, showing that the broadening of the absorption band due to the surface plasmon can be explained by the usual electron-phonon coupling model.
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In situ detection of faradaic current in probe oxidation using a dynamic force microscope

TL;DR: In this article, a faradaic current on the order of a sub-pico-ampere was detected while fabricating two-dimensional oxide nanostructures on H-passivated Si(001) surfaces.
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Large third‐order optical nonlinearity of nanometer‐sized amorphous semiconductor: Phosphorous colloids formed in SiO2 glass by ion implantation

TL;DR: In this paper, large nonlinear susceptibility χ(3) of amorphous red phosphorous colloid particles (3-5 nm in diameter) and SiO2 glasses have been fabricated by ion implantation technique.
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Laser scanning microscope for low temperature single molecule and microscale spectroscopy based on gradient index optics

TL;DR: In this article, a scanning optical microscope for low temperature imaging and spectroscopy with a gradient index rod-shaped microlens as an objective lens is presented, where the solid immersion effect enhances the resolution to 310 nm of the full width at half-maximum at the wavelength of 545 nm.