T
Takuji Ogihara
Researcher at Mitsubishi Electric
Publications - 8
Citations - 49
Takuji Ogihara is an academic researcher from Mitsubishi Electric. The author has contributed to research in topics: Automatic test pattern generation & Sequential logic. The author has an hindex of 4, co-authored 8 publications receiving 49 citations.
Papers
More filters
Proceedings ArticleDOI
Test Generation for Scan Design Circuits with Tri-State Modules and Bidirectional Terminals
TL;DR: A program which generates test patterns for scan design circuits with tri-state modules and bidirectional terminals by using shift-in function of SRLs by using path sensitization technique with 14 signal values.
Proceedings ArticleDOI
An Integrated Computer Aided Design System for Gate Array Masterslices: Part 1. Logic Reorganization System Lores-2
Chiyoji Tanaka,Shinichi Murai,Shunichiro Nakamura,Takuji Ogihara,Masayuki Terai,Kozo Kinoshita +5 more
TL;DR: The outline and the application results of a computer aided logic design system which combines automatic translation of TTL SSI/MSI logic into gate array logic, human intervention, auxiliary logic simulation, and automatic documentation are described.
Proceedings ArticleDOI
Tri-state bus conflict checking method for ATPG using BDD
TL;DR: A bus design rule checking method which efficiently checks whether signal conflicts may occur on the tri-state buses in a given circuit and whether the buses may be in floating states is described.
Journal ArticleDOI
LORES-2: A Logic Reorganization System
TL;DR: LORES-2 uses a macro-expansion technique to help designers transform printed-circuit assembly logic composed of SSI and MSI circuits into master-slice LSI logic circuits.
Proceedings ArticleDOI
ASTA: LSI Design Management System
TL;DR: An LSI design management system which automates CAD program performance analysis and the collection of such statistical information as the sizes of the circuits being designed is dealt with.