scispace - formally typeset
T

Takuji Ogihara

Researcher at Mitsubishi Electric

Publications -  8
Citations -  49

Takuji Ogihara is an academic researcher from Mitsubishi Electric. The author has contributed to research in topics: Automatic test pattern generation & Sequential logic. The author has an hindex of 4, co-authored 8 publications receiving 49 citations.

Papers
More filters
Proceedings ArticleDOI

Test Generation for Scan Design Circuits with Tri-State Modules and Bidirectional Terminals

TL;DR: A program which generates test patterns for scan design circuits with tri-state modules and bidirectional terminals by using shift-in function of SRLs by using path sensitization technique with 14 signal values.
Proceedings ArticleDOI

An Integrated Computer Aided Design System for Gate Array Masterslices: Part 1. Logic Reorganization System Lores-2

TL;DR: The outline and the application results of a computer aided logic design system which combines automatic translation of TTL SSI/MSI logic into gate array logic, human intervention, auxiliary logic simulation, and automatic documentation are described.
Proceedings ArticleDOI

Tri-state bus conflict checking method for ATPG using BDD

TL;DR: A bus design rule checking method which efficiently checks whether signal conflicts may occur on the tri-state buses in a given circuit and whether the buses may be in floating states is described.
Journal ArticleDOI

LORES-2: A Logic Reorganization System

TL;DR: LORES-2 uses a macro-expansion technique to help designers transform printed-circuit assembly logic composed of SSI and MSI circuits into master-slice LSI logic circuits.
Proceedings ArticleDOI

ASTA: LSI Design Management System

TL;DR: An LSI design management system which automates CAD program performance analysis and the collection of such statistical information as the sizes of the circuits being designed is dealt with.