Showing papers by "Timothy J. Maloney published in 2022"
DOI•
18 Sep 2022
TL;DR: A resistor-blocked pogo pin using a 1MO chip resistor was previously simulated, built, and tested to show device failures as mentioned in this paper , which revealed a case where CDM failure was caused exclusively by the fast rise time portion of the current.
Abstract: A resistor-blocked pogo pin using a 1MO chip resistor was previously simulated, built, and tested to show device failures. Resistor-blocked pin zap constituents are calculated with electrostatics, giving charge quantities for fast pulses. Novel fast-pulse arrangements revealed a case where CDM failure was caused exclusively by the fast rise-time portion of the current.
TL;DR: In this article, the frequency domain spectra is analyzed to demonstrate why the IEC generators are not repeatable across equipment, and an analysis of an IEC pulser's waveform is performed to show the well-controlled spectrum and the repeatability from event to event.