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Tom McKone

Researcher at Lawrence Berkeley National Laboratory

Publications -  5
Citations -  412

Tom McKone is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Exposure assessment & Multimedia fugacity model. The author has an hindex of 4, co-authored 5 publications receiving 375 citations.

Papers
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Journal ArticleDOI

BETR North America: A regionally segmented multimedia contaminant fate model for North America

TL;DR: The Berkeley-Trent North American contaminant fate model (BETR North America) as mentioned in this paper is a regionally segmented multimedia contaminant model based on the fugacity concept.
Journal ArticleDOI

Adoption of an official ISEA glossary.

TL;DR: The process through which the ISEA adopted the IPCS glossary as the official ISEA glossary is described and plans for how the glossary can be used by ISEA and updated over time are discussed.
Journal ArticleDOI

A multimedia, multiple pathway risk assessment of atrazine: the impact of age differentiated exposure including joint uncertainty and variability

TL;DR: In this paper, the authors present a framework for evaluating the differences in exposure to pesticides between children and adults through multiple exposure pathways, and a sensitivity analysis was completed to determine the relative importance of parameters with respect to the outcome.
Journal ArticleDOI

A multimedia, multiple pathway exposure assessment of atrazine: fate, transport and uncertainty analysis

TL;DR: A multimedia transport model was used to determine the concentration of atrazine in surface water, ground water, surface soil, root zone soil, plants, and air at a typical midwestern location as mentioned in this paper.
Book ChapterDOI

Chapter 44 – Modeling and Predicting Pesticide Exposures

TL;DR: This chapter appraises the available models for predicting exposure to pesticide, including isolated systems, which are important in modeling pesticide formulation and manufacturing but are not directly pertinent to pesticide exposure modeling.