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Tom Pialucha

Researcher at Imperial College London

Publications -  12
Citations -  337

Tom Pialucha is an academic researcher from Imperial College London. The author has contributed to research in topics: Adhesive & Thin layers. The author has an hindex of 9, co-authored 12 publications receiving 308 citations.

Papers
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Journal ArticleDOI

Amplitude spectrum method for the measurement of phase velocity

TL;DR: In this paper, an amplitude spectrum technique for the measurement of the phase velocities of waves in media, which can be dispersive and attenuating is presented, where the variation of phase velocity with frequency is calculated from the longitudinal resonant frequencies, the corresponding mode numbers and the distance between the boundaries of the tested material.
Journal ArticleDOI

The detection of thin embedded layers using normal incidence ultrasound

TL;DR: In this paper, a theoretical investigation of the use of normal incidence ultrasonic reflection measurements for the detection and characterization of thin layers embedded between two much thicker media has been carried out, and it has been shown that the relationship between the normal incidence longitudinal reflection coefficient and frequency is defined by the reflection coefficients at zero frequency and at half the resonance frequency of the layer.
Journal ArticleDOI

A signal regeneration technique for long-range propagation of dispersive Lamb waves

TL;DR: In this paper, a technique which enables a dispersive Lamb wave to be propagated over a considerable distance to give a simple waveform at the receiver position is described, which works by launching a signal which, by superposition of its frequency components, will recombine to form a signal with a simple shape (a pulse or tone burst) at the measurement position.
Journal ArticleDOI

The characterization of oxide layers in adhesive joints using ultrasonic reflection measurements

TL;DR: In this article, the use of ultrasonic reflection coefficient measurements at both normal and oblique incidence for the detection and characterization of oxide layers at the adhesive-adherend interface in adhesive joints has been investigated.
Book ChapterDOI

The Reflection of Ultrasound from Interface Layers in Adhesive Joints

TL;DR: The detection of weak interfaces in an adhesive joint is one of the major current challenges in NDE; the lack of a satisfactory non destructive test for this region is retarding the exploitation of the advantages of adhesive bonding in safety critical areas as discussed by the authors.