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Toshiyuki Sawa

Researcher at Hiroshima University

Publications -  263
Citations -  1914

Toshiyuki Sawa is an academic researcher from Hiroshima University. The author has contributed to research in topics: Flange & Gasket. The author has an hindex of 22, co-authored 263 publications receiving 1765 citations. Previous affiliations of Toshiyuki Sawa include University of Yamanashi.

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A two-dimensional stress analysis of single-lap adhesive joints of dissimilar adherends subjected to tensile loads

TL;DR: In this article, single-lap adhesive joints of dissimilar adherends subjected to tensile loads are analyzed as a three-body contact problem using the two-dimensional theory of elasticity.
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Effect of adhesive thickness, adhesive type and scarf angle on the mechanical properties of scarf adhesive joints☆

TL;DR: In this paper, the effects of adhesive thickness, adhesive type and scarf angle on the mechanical properties of a scarf adhesive joint (SJ) subjected to uniaxial tensile loading are examined using a mixed-mode cohesive zone model (CZM) with a bilinear shape to govern the interface separation.
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A Stress Analysis of Pipe Flange Connections

TL;DR: In this article, the distribution of contact stresses which governs the sealing performance is analyzed as a three-body contact problem, using an axisymmetrical three-dimensional theory of elasticity.
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Three-dimensional finite element analysis of single-lap adhesive joints under impact loads

TL;DR: In this article, the effects of Young's modulus of adherends, the overlap length, the adhesive thickness and the adherend thickness on the stress wave propagations and stress distributions at the interfaces have been examined.
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Stress analysis and strength evaluation of scarf adhesive joints subjected to static tensile loadings

TL;DR: In this paper, the authors analyzed the stress distributions in scarf adhesive joints under static tensile loadings using three-dimensional finite-element calculations and found that the maximum value of the maximum principal stress occurs at the edge of the interfaces.