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VJ Logeeswaran

Researcher at Hewlett-Packard

Publications -  4
Citations -  93

VJ Logeeswaran is an academic researcher from Hewlett-Packard. The author has contributed to research in topics: Superlens & Nanophotonics. The author has an hindex of 1, co-authored 4 publications receiving 92 citations.

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Journal ArticleDOI

A smooth optical superlens

TL;DR: In this article, a smooth and low loss silver (Ag) optical superlens capable of resolving features at 1/12th of the illumination wavelength with high fidelity was demonstrated. But this was made possible by utilizing state-of-the-art nanoimprint technology and intermediate wetting layer of germanium (Ge) for the growth of flat silver films with surface roughness at subnanometer scales.
Journal ArticleDOI

Incident light angle dependence of microwalled silicon solar cell efficiency for fracture transfer printing applications

TL;DR: In this article, a fracture transfer printing method was used for fabrication of substrate free microwalled photovoltaic devices for maximum light harvesting, and the results showed that reflection is minimized for light incidence angle greater than 5° with respect to the surface normal to the solar cell plane.
Posted Content

Molecular Scale Imaging with a Smooth Superlens

TL;DR: In this article, a smooth and low loss silver (Ag) optical superlens capable of resolving features at 1/12th of the illumination wavelength with high fidelity was demonstrated. But this was made possible by utilizing state-of-the-art nanoimprint technology and intermediate wetting layer of germanium (Ge) for the growth of flat silver films with surface roughness at sub-nanometer scales.
Proceedings ArticleDOI

Molecular Scale Imaging with A Smooth Superlens

TL;DR: In this paper, the authors proposed a novel approach of optical imaging with resolution far beyond the diffraction limit, which enables parallel imaging and nanofabrication in a single snapshot, a feat that is not yet available with other nanoscale imaging techniques such as atomic force microscope or scanning electron microscope.