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W.J. Goedheer
Researcher at Utrecht University
Publications - 18
Citations - 209
W.J. Goedheer is an academic researcher from Utrecht University. The author has contributed to research in topics: Plasma-enhanced chemical vapor deposition & Silicon. The author has an hindex of 7, co-authored 18 publications receiving 208 citations.
Papers
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Journal Article
On the transmission function of an ion-energy and mass spectrometer
TL;DR: In this paper, the operation of a mass spectrometer system with an electrostatic energy analyser, designed for measurements of mass-resolved ion-energy distributions, is discussed.
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Growth mechanism of microcrystalline silicon at high pressure conditions
TL;DR: In this paper, a diagnosis of the plasma process for high rate deposition of microcrystalline silicon by very high frequency plasma-enhanced chemical vapor deposition (VHF PECVD) is explored.
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Influence of Pressure and Plasma Potential on High Growth Rate Microcrystalline Silicon Grown by Very High Frequency Plasma Enhanced Chemical Vapour Deposition
TL;DR: In this paper, the defect density increases one order of magnitude upon the increase in deposition rate from 0.45 to 4.5 nm/s. This increase in defect density is partially attributed to the increased energy of the ion bombardment during the plasma deposition.
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Deposition rate in modulated radio-frequency silane plasmas
TL;DR: In this article, the authors studied the deposition rate of amorphous silicon by a square-wave amplitude-modulated radio-frequency excitation, and showed that the optimum deposition rate at a modulation frequency of about 100 kHz is determined by the decay time of the electron density.
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Compensation of decreased ion energy by increased hydrogen dilution in plasma deposition of thin film silicon solar cells at low substrate temperatures
A.D. Verkerk,M.M. de Jong,Jatindra K. Rath,M. Brinza,Ruud E. I. Schropp,W.J. Goedheer,Valeria V. Krzhizhanovskaya,Yuriy E. Gorbachev,K. E. Orlov,E.M. Khilkevitch,A. S. Smirnov +10 more
TL;DR: In this paper, the effect of deposition temperature on the energies of ions reaching the substrate was measured using an electrostatic ion energy analyzer, where the ion energy decreases with decreasing temperature, but this can be compensated by diluting the silane source gas by hydrogen.