W
Wen-Li Wu
Researcher at National Institute of Standards and Technology
Publications - 8
Citations - 202
Wen-Li Wu is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Thin film & Silicon. The author has an hindex of 5, co-authored 8 publications receiving 197 citations.
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Journal ArticleDOI
Mass density of polystyrene thin films measured by twin neutron reflectivity
TL;DR: In this article, reflectivity measurements on polystyrene thin films (6.5-79.0 nm) supported on silicon substrates indicate that the mass density is near the bulk value regardless of film thickness.
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Interface effects on moisture absorption in ultrathin polyimide films
TL;DR: In this paper, the effect of several variables on the absorption of moisture were monitored in polyimide films adhered to polished silicon substrates, including total dry film thickness, exposure time, and the contribution of a coupling agent.
Journal Article
Acoustic modes and elastic properties of polymeric nanostructures
R. D. Hartschuh,Alexander Kisliuk,Alexei P. Sokolov,Vladimir Novikov,Paul R. Heyliger,C.M. Flannery,Ward L. Johnson,Christopher L. Soles,Wen-Li Wu +8 more
TL;DR: In this article, the phonon spectra of polymeric linear nanostructures have been characterized using Brillouin light scattering and it was shown that there is no significant deviation from bulk mechanical properties and no mechanical anisotropy in structures as small as 88nm.
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Brillouin scattering studies of polymeric nanostructures
R. D. Hartschuh,Yifu Ding,Joon Ho Roh,Alexander Kisliuk,Alexei P. Sokolov,Christopher L. Soles,Ronald L. Jones,Tengjiao Hu,Wen-Li Wu,Arpan P. Mahorowala +9 more
TL;DR: In this article, a series of thin films and parallel ridges and spacings (gratings) with ridge widths ranging from 180 to 80 nm are presented as a non-contact tool used to quantify the elastic constants in such nanostructures.
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Anomalies in the Optical Index of Refraction of Spun Cast Polystyrene Thin Films
Xuesong Hu,Kwanwoo Shin,Miriam Rafailovich,Jonathan Sokolov,Richard S. Stein,Yee Chan,Kurt Williams Wlwu,Wen-Li Wu,Rainer Kolb +8 more
TL;DR: In this paper, the authors used x-ray reflectivity in combination with optical ellipsometry to measure the optical index of refraction, n, in thin spun cast polystyrene films.