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William F. Reus

Researcher at Harvard University

Publications -  15
Citations -  1700

William F. Reus is an academic researcher from Harvard University. The author has contributed to research in topics: Monolayer & PEDOT:PSS. The author has an hindex of 14, co-authored 15 publications receiving 1511 citations.

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Journal ArticleDOI

Molecular Rectification in Metal−SAM−Metal Oxide−Metal Junctions

TL;DR: The ability of the experimental techniques described here to generate SAM-based junctions in high yield useful in physical-organic studies is demonstrated and statistical significance of the rectification ratios is demonstrated.
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Charge Transport and Rectification in Arrays of SAM-Based Tunneling Junctions

TL;DR: This paper describes a method of fabrication that generates small arrays of tunneling junctions based on self-assembled monolayers (SAMs) that enable the measurement of the electrical characteristics of the junctions as a function of chemical structure, voltage, and temperature over the range of 110-293 K.
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Mechanism of Rectification in Tunneling Junctions Based on Molecules with Asymmetric Potential Drops

TL;DR: A systematic physical-organic study reached the conclusion that only one energetically accessible molecular orbital (the HOMO of the Fc) is necessary to obtain large rectification ratios R ≈ 1.0 × 10(2) (R = |J(-V)|/|J(V)| at ±1 V).
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Odd-even effects in charge transport across self-assembled monolayers.

TL;DR: The observed difference in charge transport between n-alkanethiols with odd and even numbers of methylenes--the "odd-even effect"--is statistically discernible using these junctions and demonstrates that this technique is sensitive to small differences in the structure and properties of the SAM.
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Electrical Resistance of Ag-TS-S(CH2)(n-1)CH3//Ga2O3/EGaln Tunneling Junctions

TL;DR: In this article, a combination of structural, chemical, and electrical characterizations leads to four conclusions about AgTS-S(CH2)n−1CH3/Ga2O3/EGaIn junctions.