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Xiaoyang Chen

Researcher at Sichuan University

Publications -  15
Citations -  129

Xiaoyang Chen is an academic researcher from Sichuan University. The author has contributed to research in topics: Thin film & Dielectric. The author has an hindex of 6, co-authored 15 publications receiving 76 citations.

Papers
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Giant energy storage density in lead-free dielectric thin films deposited on Si wafers with an artificial dead-layer

TL;DR: In this paper, an ultrahigh energy storage density (W) was achieved in the Ba0.3Sr0.7Zr 0.18Ti0.82O3 (BSZT) relaxor ferroelectric thin films with the help of an ultrathin Ca0.8O1.8 (CSZ) artificial dead layer.
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An Improved Approach to Determine the Branch Index for Retrieving the Constitutive Effective Parameters of Metamaterials

TL;DR: This study finds that this method may fail to determine the branch index m in some cases, which may occur not only in the resonance band but also in non-resonance bands.
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A Novel Planar Printed Array Antenna with SRR Slots

TL;DR: In this paper, the periodic split-ring resonator (SRR) was used to design radiation slots in a printed array antenna for high gain, and a proposed array with 4×4 slots and working at 5.8 GHz has been automated designed by using the GA in conjunction with the parallel computation on a cluster.
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A genetic metamaterial and its application to gain improvement of a patch antenna

TL;DR: In this paper, a GA-designed periodic but irregular structure is applied to improve the gain of a patch antenna, which is fabricated on a printed circuit board (PCB), and consists of unit cells periodically distributed on the PCB, whose dimensions as well as conducting or nonconducting properties are determined by GA.
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Thickness-dependence of growth rate, dielectric response, and capacitance properties in Ba0.67Sr0.33TiO3/LaNiO3 hetero-structure thin films for film capacitor applications

TL;DR: In this paper, the structure, growth rate, dielectric response, and capacitance properties of (100)-oriented Ba0.67Sr0.33TiO3 (BST)/LaNiO3(LNO) hetero-structure thin films with varied BST layer thicknesses from 34´nm to 342´nm were reported.